Abstract
Nanostructured carbon-silica composite materials are prepared from different compounds in one-pot. They are characterized by BET, transmission electron microscopy, X-ray diffraction, and small-angle X-ray scattering. An effective method of the quantitative analysis of the structural dispersed characteristics of the template phase of silica in these composites is proposed.
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Original Russian Text © 2014 Yu. V. Larichev, A. P. Koskin, P. M. Eletskii, S. A. Poluyanov, F. V. Tuzikov, A. V. Ishchenko, D. A. Zyuzin.
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Translated from Zhurnal Strukturnoi Khimii, Vol. 55, No. 4, pp. 784–790, July–August, 2014.
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Larichev, Y.V., Koskin, A.P., Eletskii, P.M. et al. A small-angle x-ray scattering study of the nanostructural features of high-ash carbon materials. J Struct Chem 55, 750–756 (2014). https://doi.org/10.1134/S0022476614040258
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DOI: https://doi.org/10.1134/S0022476614040258