Abstract
An apparatus for chemical deposition of layers of different materials with pulsed automated dosing of a hot gas phase of volatile metal-organic compounds (precursors) admitted into a reaction chamber is described. The apparatus has three channels for dosing the gas precursor phase and three channels for dosing reacting gases. As an example, a technique for depositing HfO2 films on a (100)Si substrate is presented, and the deposited films are analyzed. It is shown, that this apparatus can be used to deposit layers on complex 3D systems with a large aspect ratio using an example of the deposition of HfO2 layers on the inner surfaces of channels of a microchannel plate.
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Original Russian Text © Yu.V. Shevtsov, B.M. Kuchumov, A.R. Semenov, I.K. Igumenov, 2013, published in Pribory i Tekhnika Eksperimenta, 2013, No. 3, pp. 116–120.
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Shevtsov, Y.V., Kuchumov, B.M., Semenov, A.R. et al. An apparatus for pulse chemical vapor deposition of layers. Instrum Exp Tech 56, 353–357 (2013). https://doi.org/10.1134/S002044121303010X
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DOI: https://doi.org/10.1134/S002044121303010X