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An upgraded ion source for a mass spectrometer

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Abstract

A model analysis of ion sources for dynamic mass spectrometers was performed, and the design of an upgraded ion source, which substantially reduces the ion energy spread, allows optimization of the zone of ion extraction from the source, and provides a high sensitivity of the instrument in the operation with low-energy ionizing electrons (down to threshold energies), was developed. Methodological techniques that allow one to analyze and calculate numerical model variants of ion sources of various designs using the SIMION 3D 7.0 program were developed.

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Authors and Affiliations

  1. Institute of Electron Physics, National Academy of Sciences of Ukraine, ul. Universitetskaya 21, Uzhgorod, 88017, Ukraine

    A. N. Zavilopulo & A. S. Agafonova

  2. Institite of Applied Physics, National Academy of Sciences of Ukraine, ul. Petropavlovskaya 58, Sumy, 40030, Ukraine

    E. A. Mironets

Authors
  1. A. N. Zavilopulo
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  2. E. A. Mironets
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  3. A. S. Agafonova
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Corresponding author

Correspondence to A. N. Zavilopulo.

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Original Russian Text © A.N. Zavilopulo, E.A. Mironets, A.S. Agafonova, 2012, published in Pribory i Tekhnika Eksperimenta, 2012, No. 1, pp. 73–79.

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Zavilopulo, A.N., Mironets, E.A. & Agafonova, A.S. An upgraded ion source for a mass spectrometer. Instrum Exp Tech 55, 65–71 (2012). https://doi.org/10.1134/S0020441211060315

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  • DOI: https://doi.org/10.1134/S0020441211060315

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