Abstract
The performance of the most extensively used semiconductor detectors has been investigated at cryogenic temperatures. An increase in the electric field inside a detector is shown to lead, in most cases, to restoration of its spectrometric properties. A conclusion is drawn that semiconductor detectors are applicable at temperatures of 1–77 K.
Similar content being viewed by others
References
Del Rosso, A., Augsburger, M., Boreiko, V.F., et al., Hyperfine Interact., 1999, vol. 118, p. 177.
Wouters, J., De Moor, P., Schuurmans, P., et al., Hyperfine Interact., 1992, vol. 75, p. 379.
Luke, P.N., Beeman, J., Goulding, F.S., et al., Nucl. Instrum. Methods Phys. Res., Sect. A, 1990, vol. 289, p. 406.
Spooner, N.J.C., Hommer, G.J., Smith, P.F., and Bewick, A., IEEE Trans. Nucl. Sci., 1993, vol. 40, no. 3, p. 275.
Gregoire, G., Heugheraert, J., Lemaitre, G., et al., Nucl. Instrum. Methods Phys. Res., 1964, vol. 28, p. 346.
Dodge, W.R., Domen, S.R., Hirshfeld, A.T., and Hopes, P.D., IEEE Trans. Nucl. Sci., 1964, vol. 11, p. 238; Dodge, W.R., Domen, S.R., Hirshfeld, A.T., and Hopes, P.D., IEEE Trans. Nucl. Sci., 1965, vol. 12, p. 295.
Tambovtsev, D.I. and Kozlovskii, L.K., Prib. Tekh. Eksp., 1969, no. 5, p. 59.
Martini, M. and McMath, T.A., Nucl. Instrum. Methods Phys. Res., 1969, vol. 76, p. 1.
Martini, M. and McMath, T.A., Nucl. Instrum. Methods Phys. Res., 1970, vol. 79, p. 259.
Afanas’eva, N.P., Eremin, V.K., Strokan, N.B., and Shamagdiev, A.Sh., Prib. Tekh. Eksp., 1982, no. 1, p. 73.
Martoff, C.J., Kaczanowicz, E., Neuhauser, B.J., et al., Nucl. Instrum. Methods Phys. Res., Sect. A, 1991, vol. 301, p. 376.
Stuck, R., Ponpon, J.P., Siffert, P., and Ricaud, C., IEEE Trans. Nucl. Sci., 1972, vol. 19, p. 270.
Vydrik, A.A., Prib. Tekh. Eksp., 1976, no. 4, p. 59.
Venos, D., Srnka, D., Slesiger, J., et al., Nucl. Instrum. Methods Phys. Res., Sect. A, 1995, vol. 365, p. 419.
Luke, P.N., Steiner, H.M., and Haller, E.E., Appl. Phys. Lett., 1982, vol. 41, p. 315.
Hansen, W.L., Nucl. Instrum. Methods Phys. Res., Sect. A, 1995, vol. 365, p. 419.
Gornov, M.G., Gurov, Yu.B., Kim Zai Te, et al., Prib. Tekh. Eksp., 1988, no. 1, p. 57.
Author information
Authors and Affiliations
Additional information
Original Russian Text © K.N. Gusev, Yu.B. Gurov, S.L. Katulina, V.N. Pavlov, V.G. Sandukovsky, 2007, published in Pribory i Tekhnika Eksperimenta, 2007, No. 2, pp. 65–69.
Rights and permissions
About this article
Cite this article
Gusev, K.N., Gurov, Y.B., Katulina, S.L. et al. A study of the performance characteristics of silicon and germanium semiconductor detectors at temperatures below 77 K. Instrum Exp Tech 50, 202–206 (2007). https://doi.org/10.1134/S0020441207020054
Received:
Issue Date:
DOI: https://doi.org/10.1134/S0020441207020054