Abstract
Amorphous silver, copper, gold, and iron films with a thickness of 6–60 nm have been grown on a polymer substrate by the method of vacuum deposition. The dependences of the specific conductivity and the microwave reflection coefficient on the film thickness are obtained and a relation between these values is established.
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Translated from Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 74, No. 11, 2004, pp. 102–106.
Original Russian Text Copyright © 2004 by Antonets, Kotov, Nekipelov, Karpushov.
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Antonets, I.V., Kotov, L.N., Nekipelov, S.V. et al. Conducting and reflecting properties of thin metal films. Tech. Phys. 49, 1496–1500 (2004). https://doi.org/10.1134/1.1826197
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DOI: https://doi.org/10.1134/1.1826197