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Electrical properties of YBa2Cu3O7−x films of various thicknesses

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Abstract

We have studied the electrical properties of high-T c superconductor YBa2Cu3O7−x films obtained by the ion-plasma deposition technique on sapphire substrates. Dependences of the surface resistance and the critical current density on the film thickness are determined.

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Authors and Affiliations

  1. St. Petersburg State Electrotechnical University, St. Petersburg, Russia

    S. V. Razumov & A. V. Tumarkin

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  1. S. V. Razumov
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  2. A. V. Tumarkin
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 29, No. 3, 2003, pp. 29–32.

Original Russian Text Copyright © 2003 by Razumov, Tumarkin.

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Razumov, S.V., Tumarkin, A.V. Electrical properties of YBa2Cu3O7−x films of various thicknesses. Tech. Phys. Lett. 29, 97–98 (2003). https://doi.org/10.1134/1.1558736

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  • DOI: https://doi.org/10.1134/1.1558736

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