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Specific properties of the PZT-based thin-film capacitor structures with excess lead oxide

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Abstract

The effect of excess lead oxide on the microstructure and ferroelectric properties of lead zirconate titanate (PZT) films was studied in PZT-based thin-film capacitor structures. It is shown that excess lead in the form of lead oxide is localized at the grain boundaries and film-platinum electrode interfaces, which can result in the appearance of internal electric fields and the self-polarization of PZT films. It is suggested that the selfpolarization effect is related to the formation of a built-in electric charge with different densities at the bottom and top metal electrode-ferroelectric film interfaces.

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Authors and Affiliations

  1. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg, 194021, Russia

    V. P. Afanas’ev, G. N. Mosina, A. A. Petrov, I. P. Pronin, L. M. Sorokin & E. A. Tarakanov

  2. St. Petersburg State Electrotechnical University, St. Petersburg, Russia

    V. P. Afanas’ev, G. N. Mosina, A. A. Petrov, I. P. Pronin, L. M. Sorokin & E. A. Tarakanov

Authors
  1. V. P. Afanas’ev
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  2. G. N. Mosina
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  3. A. A. Petrov
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  4. I. P. Pronin
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  5. L. M. Sorokin
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  6. E. A. Tarakanov
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 27, No. 11, 2001, pp. 56–63.

Original Russian Text Copyright © 2001 by Afanas’ev, Mosina, Petrov, Pronin, Sorokin, Tarakanov.

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Afanas’ev, V.P., Mosina, G.N., Petrov, A.A. et al. Specific properties of the PZT-based thin-film capacitor structures with excess lead oxide. Tech. Phys. Lett. 27, 467–469 (2001). https://doi.org/10.1134/1.1383827

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  • DOI: https://doi.org/10.1134/1.1383827

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