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Determination of the impact excitation cross section for luminophor activators using voltage-luminance characteristics of thin-film electroluminescent structures

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Abstract

A new method is proposed for determining the parameters of emission centers in the luminophor layer of a ZnS-based thin-film electroluminescent display. The method was experimentally verified to yield correct values of the activator concentration and the impact excitation cross section. The results are compared to the data reported previously.

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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 27, No. 8, 2001, pp. 74–80.

Original Russian Text Copyright © 2001 by Samokhvalov, Davydov, Khadiullin.

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Samokhvalov, M.K., Davydov, R.R. & Khadiullin, É.I. Determination of the impact excitation cross section for luminophor activators using voltage-luminance characteristics of thin-film electroluminescent structures. Tech. Phys. Lett. 27, 341–343 (2001). https://doi.org/10.1134/1.1370221

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  • DOI: https://doi.org/10.1134/1.1370221

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