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Waveguide spectroscopy of thin films

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Abstract

A waveguide method of measurement of the absorption spectra of thin films in the range of their transparency is considered. The absorption spectra obtained by this method for the thin films of tin oxide and zinc oxide in a wavelength range from 400 to 800 nm are presented. The error of measurement of the absorption spectrum did not exceed 5% for an ∼0.1-μ-thick film with an absorption coefficient of ∼50 cm−1. Possibilities and limitations of the method are discussed.

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Authors and Affiliations

  1. Institute of Applied Optics, National Academy of Sciences of Belarus, Mogilev, Belarus

    A. V. Khomchenko

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  1. A. V. Khomchenko
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 27, No. 7, 2001, pp. 17–25.

Original Russian Text Copyright © 2001 by Khomchenko.

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Khomchenko, A.V. Waveguide spectroscopy of thin films. Tech. Phys. Lett. 27, 271–274 (2001). https://doi.org/10.1134/1.1370198

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  • DOI: https://doi.org/10.1134/1.1370198

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