Abstract
The waveguide technique for measuring the absorption spectra of thin films in spectral range of their transparency is considered. The error of measuring the absorption of a ∼0.1 μm thick film does not exceed 5% at an absorption coefficient of less than 50 cm–1. Capabilities and limitations of the method are discussed.
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Original Russian Text © A.V. Khomchenko, 2016, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2016, Vol. 80, No. 4, pp. 470–475.
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Khomchenko, A.V. Measurements of absorption spectra of thin films by the waveguide technique. Bull. Russ. Acad. Sci. Phys. 80, 426–430 (2016). https://doi.org/10.3103/S1062873816040183
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DOI: https://doi.org/10.3103/S1062873816040183