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Intracavity Waveguide Spectroscopy of Thin Films

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Abstract

The method of intracavity waveguide spectroscopy for measuring low optical losses in thin films is proposed. The method also allows one to distinguish transverse and longitudinal modes in low-gain lasers without introducing considerable losses into the cavity.

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Authors and Affiliations

  1. Belarusian–Russian University, Mogilev, 212000, Belarus

    A. V. Shulga, A. V. Khomchenko & I. V. Shilova

Authors
  1. A. V. Shulga
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  2. A. V. Khomchenko
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  3. I. V. Shilova
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Corresponding author

Correspondence to A. V. Khomchenko.

Additional information

Original Russian Text © A.V. Shulga, A.V. Khomchenko, I.V. Shilova, 2018, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2018, Vol. 44, No. 21, pp. 3–9.

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Shulga, A.V., Khomchenko, A.V. & Shilova, I.V. Intracavity Waveguide Spectroscopy of Thin Films. Tech. Phys. Lett. 44, 953–955 (2018). https://doi.org/10.1134/S1063785018110159

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  • DOI: https://doi.org/10.1134/S1063785018110159

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