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Investigation of the structure of thin layers of hexadecane on a metal substrate by infrared spectroscopy

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Abstract

Infrared spectroscopy was used to analyze the structure of 0.5–10 μm thick layers of hexadecane on a metal substrate in the range 3000–2800 cm−1. The results suggest that density fluctuations occur in layers between 3 and 10 μm thick, whereas the hexadecane crystallizes in thinner layers.

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Authors and Affiliations

  1. A. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, St. Petersburg

    V. I. Vettegren’ & A. I. Tupitsyna

  2. Institute of Problems in Mechanical Engineering, Russian Academy of Sciences, St. Petersburg

    V. I. Vettegren’ & A. I. Tupitsyna

Authors
  1. V. I. Vettegren’
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  2. A. I. Tupitsyna
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Zh. Tekh. Fiz. 24, 24–28 (May 26, 1998)

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Vettegren’, V.I., Tupitsyna, A.I. Investigation of the structure of thin layers of hexadecane on a metal substrate by infrared spectroscopy. Tech. Phys. Lett. 24, 381–382 (1998). https://doi.org/10.1134/1.1262131

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  • DOI: https://doi.org/10.1134/1.1262131

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