Abstract
Steady-and nonsteady-state photovoltages appearing in a multilayer structure with p-n junctions under the conditions of nonuniform illumination are considered for an arbitrary ratio between the diffusion length L and the sizes d of the p-and n-regions. It is shown that, for
, the photovoltage is substantially lower (by d 2/12L 2 times) than in the case of
owing to the mutual influence of neighboring p-n junctions. Relaxation of the photovoltage is controlled by recharging of the barrier capacitances of p-n junctions, and the relaxation time exceeds by several orders of magnitude the lifetime of nonequilibrium charge carriers in the p-and n-regions. The results obtained make it possible to explain the special features of the effect of anomalous photovoltage in polycrystalline films.
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References
É. I. Adirovich, É. M. Mastov, and Yu. M. Yuabov, Fiz. Tekh. Poluprovodn. 5(7), 1415 (1971) [Sov. Phys. Semicond. 5, 1241 (1971)].
É. I. Adirovich, Fiz. Tekh. Poluprovodn. 4(4), 745 (1970) [Sov. Phys. Semicond. 4, 629 (1970)].
É. I. Adirovich, É. M. Mastov, and Yu. M. Yuabov, Dokl. Akad. Nauk SSSR 188, 1254 (1969).
I. A. Karpovich and M. V. Shilova, Izv. Vyssh. Uchebn. Zaved., Fiz. 4, 128 (1969).
V. V. Osipov, A. Yu. Selyakov, and M. Foygel, Fiz. Tekh. Poluprovodn. 32(2), 221 (1998) [Semicond. 32, 201 (1998)].
V. I. Stafeev, Fiz. Tekh. Poluprovodn. 6, 2134 (1972) [Sov. Phys. Semicond. 6, 1811 (1972)].
V. N. Agarev and V. I. Stafeev, Radiotekh. Élektron. 22(1), 169 (1977).
V. N. Agarev and V. I. Stafeev, Radiotekh. Élektron. 22(11), 2335 (1977).
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Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 34, No. 4, 2000, pp. 452–454.
Original Russian Text Copyright © 2000 by Agarev, Stepanova.
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Agarev, V.N., Stepanova, N.A. On the theory of anomalous photovoltage in multilayer structures with p-n junctions. Semiconductors 34, 438–440 (2000). https://doi.org/10.1134/1.1188003
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DOI: https://doi.org/10.1134/1.1188003