Abstract
An automatic computerized system simultaneously measuring the thickness of the surface layer and the semiconducting characteristics of oxide and other surface layers on an electrode surface during the corrosion or any other electrochemical studies is described. The automatic recording of ellipsometric parameters and a photopotential at sharply focusing the probing laser beam at a chosen surface site provides the extremely high sensitivity to the microscopically localized passivation and depassivation processes. The phase-modulation principle of recording the ellipsometric parameters with a laser source, which is most promising for the local corrosion–electrochemical investigation, is naturally combined with the technique of measuring photo-emf with the modulation of not only the phase, but also the intensity of the incident radiation. The character of the intensity change with time (the type of modulation) can be arbitrarily set up to the modulation frequencies of hundreds megahertz, which enables one to study photoelectrochemical processes with substantially different characteristic times (such as the lifetime of electron or hole carriers in the surface oxide).
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Kotenev, V.A. Laser-Ellipsometric and Photoelectrometric (EPEM) Video Microprobe. Protection of Metals 39, 587–594 (2003). https://doi.org/10.1023/B:PROM.0000007854.58070.98
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DOI: https://doi.org/10.1023/B:PROM.0000007854.58070.98