Abstract
An X-ray detection unit based on an epitaxial GaAs detector is described. The energy resolution for energies of 59.6, 26.4, and 5.9 keV is 1.04, 0.94, and 0.84 keV, respectively, while the noise level measured with the generator is 760 eV. These parameters are compared to the characteristics of other detectors used for X-ray fluorescent analysis.
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Gryaznov, D.V., Lupilov, A.V. An X-ray Detection Unit Based on GaAs Detector. Instruments and Experimental Techniques 43, 815–817 (2000). https://doi.org/10.1023/A:1026640505886
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DOI: https://doi.org/10.1023/A:1026640505886