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X-ray Diffraction Study of an Inhomogeneous Langasite (La3Ga5SiO14) Crystal

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Abstract

A Czochralski-grown langasite, La3Ga5SiO14 (La3Ga4(GaSi)O14), crystal was studied by x-ray diffraction. The crystal was found to consist of two isostructural solid solutions, except in the center of the tail end. The solid solutions differ in the Ga and Si occupancies on the (Ga,Si) site: Ga > Si in solid solution I, and Si > Ga in solid solution II. The composition of I (center of the tail end) is La3Ga4(Ga1.14Si0.86(4))O13.84□0.16(11). The composition of II, which coexists with I in the peripheral part of the tail end, is (La2.95□0.05)Ga4(Ga0.84Si1.16(6))O14.

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Authors and Affiliations

  1. Lomonosov State Academy of Fine Chemical Technology, pr. Vernadskogo 87, Moscow, 117571, Russia

    G. M. Kuz'micheva

  2. Moscow State University, Moscow, 119899, Russia

    V. B. Rybakov

  3. All-Russia Research Institute of Mineral Materials Synthesis, Institutskaya ul. 1, Aleksandrov, Vladimir oblast, 601650, Russia galkuz@orc.ru

    E. N. Domoroshchina & A. B. Dubovskii

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  1. G. M. Kuz'micheva
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  2. V. B. Rybakov
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  3. E. N. Domoroshchina
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  4. A. B. Dubovskii
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Kuz'micheva, G.M., Rybakov, V.B., Domoroshchina, E.N. et al. X-ray Diffraction Study of an Inhomogeneous Langasite (La3Ga5SiO14) Crystal. Inorganic Materials 38, 1040–1047 (2002). https://doi.org/10.1023/A:1020585506932

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