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Scanning probe microscopy studies of Ebonex® electrodes

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Abstract

The porosity of Ebonex® electrodes is known to have a marked affect on their electrochemical properties. Atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) have been used to investigate the topography of porous and fully-hardened (nonporous) Ebonex® at high resolution. AFM has also been used to study the early stages of copper electrodeposition on porous Ebonex® electrodes. Initial copper nucleation and growth were found to occur preferentially at surface pores.

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SMITH , J.R., NAHLE´, A.H. & WALSH , F.C. Scanning probe microscopy studies of Ebonex® electrodes. Journal of Applied Electrochemistry 27, 815–820 (1997). https://doi.org/10.1023/A:1018472828682

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