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Interface effects on the nonlinear optical properties of thin films

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Abstract

The optical nonlinearity of low-dimension structures is studied in the self-effect case at a wavelength of 630 nm in a range of light intensities below 0.1 W/cm2 by waveguide methods. Common tendencies in relationships between intensity of light and optical properties of multilayer structures and semiconductor-doped glass films are detected. It is shown that the state of interfaces determines the character of optical nonlinearity.

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Authors and Affiliations

  1. Institute of Applied Optics NAS of Belarus, 11 Belynitskogo-Biruli St., 212793, Mogilev, Belarus

    A.V. Khomchenko & E.V. Glasunov

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  1. A.V. Khomchenko
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  2. E.V. Glasunov
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Khomchenko, A., Glasunov, E. Interface effects on the nonlinear optical properties of thin films. Optical and Quantum Electronics 34, 359–368 (2002). https://doi.org/10.1023/A:1015010607483

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