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Single-crystal neutron diffraction under high pressures: valence instabilities in Tm monochalcogenides

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Abstract

New high-pressure devices based on the use of sapphire anvils now allow single-crystal neutron diffraction experiments to be performed up to P=8–10 GPa. After giving a brief overview of the technique, we present its application to the study of pressure-induced valence instabilities in Tm monochalcogenides (TmX, X: S, Se, Te). A variety of new magnetic phases have been characterized, yielding a consistent picture of the evolution of magnetism through the series. The results indicate a striking interplay between magnetic order taking place at low temperature and different types of electronic ground states (classical semiconductor, narrow-gap Kondo insulator, metallic Kondo lattice, etc.) inferred from the transport properties.

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Authors and Affiliations

  1. Laboratoire Léon Brillouin, CEA-CNRS, CEA/Saclay, F-91191, Gif sur Yvette, France

    J.-M. Mignot, I.N. Goncharenko & P. Link

  2. Russian Research Centre “Kurchatov Institute”, 123182, Moscow, Russia

    I.N. Goncharenko

  3. Institut für Physikalische Chemie, Universität Göttingen, Tammannstr. 6, Göttingen, Germany

    P. Link

  4. Department of Physics, Tohoku University, Sendai, 980-77, Japan

    T. Matsumura

  5. National Research Institute for Metals, Tsukuba, Ibaraki, 305-0047, Japan

    T. Suzuki

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Mignot, JM., Goncharenko, I., Link, P. et al. Single-crystal neutron diffraction under high pressures: valence instabilities in Tm monochalcogenides. Hyperfine Interactions 128, 207–224 (2000). https://doi.org/10.1023/A:1012687700361

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