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Rigorous electromagnetic analysis of resonant sub-wavelength metallic gratings by parametric Fourier modal method

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Abstract

Electromagnetic TM modes of metallic lamellar reflection or transmission gratings are analyzed by means of the parametric fourier modal method. We show that the resonant optical response of such devices is due to the excitation of guided waves inside the slits. Our rigorous methods allows us to define a resonance condition number and to calculate the field everywhere inside the grating layer.

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Authors and Affiliations

  1. Laboratoire des Sciences et Matériaux pour L'Electronique et d'Automatique, Unité Mixte de Recherche Associée au Centre national de la Recherche Scientifique, Université Blaise Pascal, 6602, Les Cézeaux, Aubière cedex, France

    Gérard Granet

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  1. Gérard Granet
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Granet, G. Rigorous electromagnetic analysis of resonant sub-wavelength metallic gratings by parametric Fourier modal method. Optical and Quantum Electronics 33, 471–483 (2001). https://doi.org/10.1023/A:1010851103013

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  • DOI: https://doi.org/10.1023/A:1010851103013

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