Abstract
This paper analyzes the detectability of resistive bridging faults in CMOS (micro)-pipelined circuits. Logic and electrical level detection conditions are provided for functional and I ddq testing techniques. The kind of operations and the sensitivity to dynamic fault effects of pipelined circuits make such conditions more complex than in the combinational case. In particular, it is shown that the kind of used latches has a relevant impact on fault coverage, and should be carefully accounted in test generation and fault simulation. Finally, guidelines are drawn for the extension of combinational test generation and fault simulation algorithms to the considered case.
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Favalli, M., Metra, C. Bridging Faults in Pipelined Circuits. Journal of Electronic Testing 16, 617–629 (2000). https://doi.org/10.1023/A:1008321304131
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DOI: https://doi.org/10.1023/A:1008321304131