Abstract
A plasma-source, simultaneously detecting, Mattauch-Herzog mass spectrograph for multi-element analysis was developed. Simultaneous detection should improve throughput, precision, and sensitivity over those instruments that use quadrupole or sector mass spectrometers. The new instrument is compact (approximately 80 cm in length) and is designed to detect a complete atomic mass spectrum in two mass windows that straddle but avoid argon. The design and some figures of merit are presented. With a dc glow discharge source, a precision of 0. 5% determined from eight consecutive 10-s images was obtained for Cu isotope ratios in Naval Brass B. With the same sample, nickel and lead were detected at limits of 8 and 1 ppm. Measured Mg isotope ratios with an inductively coupled plasma source were within 4% of the expected values. The resolution at full width at half maximum is currently limited to approximately 60, in part because of poor peak shape. The origin of this peak shape has been determined to lie within the array detector and possibly results from its interaction with the fringing magnetic fields produced by the second sector.
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References
Furuta, N. J. Anal. At. Spectrom. 1991, 6, 199.
Thomson, J. J. Rays of Positive Electricity and Their Application to Chemical Analyses; Longmans Green: London, 1913.
Dempster, A. J. Phys. Rev. 1918, 11, 316–325.
Aston, F. W. Phil. Mag. 1919, 38, 707–714.
Thomson, J. J.; Thomson, G. P. Conduction of Electricity Through Gases, 3rd ed., Vol. 1; University Press: Cambridge, 1928.
Aston, F. W. Mass Spectra and Isotopes, 2nd ed.; Edward Arnold: London, 1942.
Giffen, C. E.; Boettger, H. G.; Norris, D. D. Int. J. Mass Spectrom. Ion Phys. 1974, 15, 437–449.
Beynon, J. H.; Jones, D. O.; Cooks, R. G. Anal. Chem. 1975, 47, 1734–1738.
Tuithof, H. H.; Boerboom, J. H.; Meuzelaar, H. L. Int. J. Mass Spectrom. Ion Phys. 1975, 17, 299–307.
Yinon, J.; Boettger, H. G. Proceedings of the 25th Annual Conference on Mass Spectrometry and Allied Topics, Washington, DC, May 29–June 3, 1977; pp 711–713.
Hedfjall, B.; Ryhage, R. Anal. Chem. 1979, 51, 1687–1690.
Boettger, H. G.; Giffen, C. E.; Norris, D. D. In ACS Symposium Series, Vol. 102; Talmi, Y., Ed.; ACS: Washington, DC, 1979, pp 291–318.
Donohue, D. L.; Carter, J. A.; Mamantov, G. Int. J. Mass Spectrom. Ion Phys. 1980, 33, 45–55.
Hedfjall, B.; Ryhage, R. Anal. Chem. 1981, 53, 1641–1644.
Louter, G. J.; Buijserd, A. N. Int. J. Mass Spectrom. Ion Phys. 1983, 50, 245–257.
Louter, G. J.; Buijserd, A. N.; Boerboom, A. J. H. Int. J. Mass Spectrom. Ion Phys. 1983, 46, 131–134.
Cottrell, J. S.; Evans, S. Anal. Chem. 1987, 59, 1990–1995.
Hill, J. A.; Biller, J. E.; Martin, S. A.; Biemann, K.; Yoshidome, K.; Sato, K. Int. J. Mass Spectrom. Ion Processes 1989, 92, 211–230.
Murphy, D. M.; Mauersberger, K. Rev. Sci. Instrum. 1985, 56, 220–226.
Murphy, D. M.; Mauersberger, K. Int. J. Mass Spectrom. Ion Processes 1987, 76, 85–93.
Sinha, M. P. In Particles in Gases and Liquids 2; Mitfal, K., Ed.; Plenum: New York, 1990, pp 197–209.
Leclercq, P. A.; Snijders, H. M. J.; Cramers, C. A.; Maurer, K. H.; Rapp, U. J. High Res. Chrom. 1989, 12, 652–656.
Leclercq, P. A.; Snijders, H. M. J.; Pesch, R.; Maurer, K. H. Proceedings of the 12th International Mass Spectrometry Conference; Amsterdam, August 1991; p 237.
Leclercq, P. A.; Cramers, C. A. J. High Res. Chrom. Chrom. Comm. 1988, 11, 845–848.
Sinha, M. P.; Gutnikov, G. Anal. Chem. 1991, 63, 2012–2016.
Matsuo, T.; Ishihara, M. J. Am. Soc. Mass Spectrom. 1993, 4, 372–386.
Matsuda, H.; Wollnik, H. Int. J. Mass Spectrom. Ion Processes 1988, 86, 53–59.
Rytz, C.; Kopp, E.; Eberhardt, P. Int. J. Mass Spectrom. Ion Processes 1994, 137, 55–66.
Cromwell, E. F.; Arrowsmith, P. Proceedings of the 41st ASMS Conference on Mass Spectrometry and Allied Topics; San Francisco, CA, May 30–June 4, 1993; Abstract ThOD 9:10.
Cromwell, E. F.; Arrowsmith, P. FACSS XXII; Cincinnati, OH, October 1995.
Cromwell, E. F.; Arrowsmith, P. J. Am. Soc. Mass Spectrom. 1996, 7, 458–466.
Spencer, N. W.; Reber, C. A. Space Res. 1963, 3, 1151–1155.
von Zahn, U.; Mauersberger, K. Rev. Sci. Instrum. 1978, 49, 1539–1542.
Nowak, P. J. C. M.; Holsboer, H. H.; Heubers, W.; Wijnaendts van Resandt, R. W.; Los, J. Int. J. Mass Spectrom. Ion Phys. 1980, 34, 375–382.
Carrico, J. P.; Johnson, M. S.; Somer, T. A. Int. J. Mass Spectrom. Ion Phys. 1973, 11, 409–415.
Nier, A. O.; Hayden, J. L. Int. J. Mass Spectrom. Ion Phys. 1971, 6, 339–346.
Nier, A. O.; Potter, W. E.; Hickman, D. R.; Mauersberger, K. Radio Science 1973, 8, 271–276.
Nier, A. O.; Schlutter, D. J. Rev. Sci. Instrum. 1985, 56, 214–219.
Nier, A. O.; Schlutter, D. J. Meteoritics 1990, 25, 263–267.
Warren, A. R.; Allen, L. A.; Pang, H.; Houk, R. S.; Janghorbani, M. Appl. Spectrosc. 1994, 48, 1360–1366.
Walder, A. J.; Freedman, P. A. J. Anal. At. Spectrom. 1992, 7, 571–575.
Taylor, P. D.; DeBievre, P.; Walder, A. J.; Entwistle, A. J. Anal. At. Spectrom. 1995, 10, 395–398.
Halliday, A. N.; Lee, D.; Christensen, J. N.; Walder, A. J.; Freedman, P. A.; Jones, C. E.; Hall, C. M.; Yi, W.; Teagle, D. Int. J. Mass Spectrom. Ion Processes 1995, 146/147, 21–33.
Koppenaal, D. W.; Barinaga, C. J.; Smith, M. R. J. Anal. At. Spectrom. 1994, 9, 1053–1058.
Duckworth, D. C.; Barshick, C. M.; Smith, D. H.; McLuckey, S. A. Anal. Chem. 1994, 66, 92–98.
Riciputi, L. R.; Duckworth, D. C.; Barshick, C. M.; Smith, D. H. Int. J. Mass Spectrom. Ion Processes 1995, 146/147, 55–64.
Watson, C. H.; Wronka, J.; Laukien, F. H.; Barshick, C. M.; Eyler, J. R. Anal. Chem. 1993, 65, 2801–2804.
Watson, C. H.; Barshick, C. M.; Wronka, J.; Laukien, F. H.; Eyler, J. R. Anal. Chem. 1996, 68, 573–575.
Myers, D. P.; Mahoney, P. P.; Li, G.; Hieftje, G. M. J. Am. Soc. Mass Spectrom. 1995, 6, 920–927.
Hintenberger, H.; Konig, L. A. In Advances in Mass Spectrometry, Vol. 1; Waldron, J. D., Ed.; Pergamon: New York, 1959, pp 16–35.
Mattauch, J.; Herzog, R. Z. Physik 1934, 89, 786–795.
Mattauch, J. Phys. Rev. 1936, 50, 617–623.
Mattauch, J. In Mass Spectroscopy in Physics Research; Hipple, J. A., Ed.; National Bureau of Standards: Washington, 1953; Circular 522, pp 1–27.
Johnson, E. G.; Nier, A. O. Phys. Rev. 1953, 91, 10–17.
Matsuda, H. Int. Mass Spectrom. Ion Processes 1976, 22, 95–102.
Rose, M. E. Phys. Rev. 1938, 53, 715–719.
Herzog, R. Z. Physik 1935, 97, 596–602.
Houk, R. S. Anal. Chem. 1986, 58, 97A-105A.
Houk, R. S.; Thompson, J. J. Mass Spectrom. Rev. 1988, 7, 425–461.
Olivares, J. A.; Houk, R. S. Anal. Chem. 1985, 57, 2674–2679.
Douglas, D. J.; French, J. B. J. Anal. At. Spectrom. 1988, 3, 743–747.
Chambers, D. M.; Poehlman, J.; Yang, P.; Hieftje, G. M. Spectrochim. Acta 1991, 46B, 741–760.
Chambers, D. M.; Hieftje, G. M. Spectrochim. Acta 1991, 46B, 761–784.
Chambers, D. M.; Ross, B. S.; Hieftje, G. M. Spectrochim. Acta 1991, 46B, 785–804.
Burgoyne, T. W.; Hieftje, G. M.; Hites, R. A. Anal. Chem. 1997, 69, 485–489.
Wiza, J. L. Nucl. Instrum. Methods 1979, 162, 587–601.
Hieftje, G. M. J. Anal. At. Spectrom. 1992, 7, 783–790.
Burgoyne, T. W.; Hieftje, G. M.; Hites, R. A., unpublished.
Brushwyler, K. R.; Furuta, N.; Hieftje, G. M. Talanta 1990, 37, 23–32.
Schram, D. C.; van der Mullen, J. A. M.; de Regt, J. M.; Benoy, D. A.; Jonkers, J.; Fey, F. H. A. G. Winter Conference on Plasma Spectrochemistry; Fort Lauderdale, FL, January 1996; pp 175–175.
Eiden, G. C.; Barinaga, C. J.; Koppenaal, D. W. J. Anal. At. Spectrom. 1996, 11, 317–322.
Gulcicek, E. E.; Whitehouse, C. M. Proceedings of the 43rd ASMS Conference on Mass Spectrometry and Allied Topics; Atlanta, GA, May 1995; pp MP057.
Guan, S.; Marshall, A. G. J. Am. Soc. Mass Spectrom. 1996, 7, 101–106.
Xu, H. J.; Wada, M.; Tanaka, J.; Katayama, I.; Ohtani, S. Nucl. Instrum. Methods 1993, A333, 274–281.
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Burgoyne, T.W., Hieftje, G.M. & Hites, R.A. Design and performance of a plasma-source mass spectrograph. J Am Soc Mass Spectrom 8, 307–318 (1997). https://doi.org/10.1016/S1044-0305(96)00290-5
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DOI: https://doi.org/10.1016/S1044-0305(96)00290-5