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Journal of Advanced Ceramics

, Volume 7, Issue 2, pp 124–142 | Cite as

Relaxor behaviour and phase transition of perovskite ferroelectrics-type complex oxides (1–x)Na0.5Bi0.5TiO3xCaTiO3 system

  • Roy Roukos
  • Nissrine Zaiter
  • Denis Chaumont
Open Access
Research Article
  • 377 Downloads

Abstract

Polycrystalline powders of (1–x)Na0.5Bi0.5TiO3xCaTiO3 ((1–x)NBT–xCT, 0 ≤ x ≤ 0.55) have been synthesized by solid state route. The effects of simultaneous substitution of Na+/Bi3+ at A-site in NBT on structural and dielectric properties were investigated. X-ray diffraction analysis revealed the phase transition from rhombohedral structure (x = 0) to orthorhombic structure (x ≥ 0.15). A distinct behaviour in dielectric properties was obtained, where for x = 0, a normal ferroelectric behaviour was observed, whereas for x ≥ 0.15, a broad dielectric anomaly was revealed such that the maximum temperature (Tm) strongly depended on the frequency and shifted towards low temperature with CT. The dielectric dispersion indicated a relaxor behaviour revealed by the degree of diffuseness and modelled via Vogel–Fulcher relation. The study highlighted the relaxor behaviour as a function of frequency and proved the transformation from a relaxor high-frequency dependence to a paraelectric phase at temperature Ts. The distinct variation of the Raman spectra at room temperature was correlated with X-ray diffraction results and proved the already mentioned transition. On heating (-193–500 °C), the Raman spectra confirmed the structural stability (Pnma) of the materials. The phonon behaviour for x = 0.15 was discussed in terms of the appearance of polar nanoregions (PNRs) into a non-polar orthorhombic matrix responsible of the relaxor behaviour. For x = 0.20, unchanged phonon behaviour confirmed the variation in dielectric behaviour where the solids transformed from a relaxor to a paraelectric state without structural phase transition.

Keywords

relaxor behaviour dielectric properties Vogel–Fulcher relationship polar nanoregions (PNRs) X-ray diffraction Raman spectroscopy 

Notes

Acknowledgements

R. Roukos and the other authors wish to acknowledge the French Ministry of Higher Education and Research and give special thanks to Dr. Fatima Barakat and Nathalie Azar for supporting this work. This work was supported by the Nanosciences Department of Université de Bourgogne.

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Authors and Affiliations

  1. 1.Laboratoire Interdisciplinaire Carnot de Bourgogne UMR 6303 CNRSUniversité de BourgogneDijonFrance

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