Abstract
Thallium lead telluride (Tl4PbTe3) was prepared by direct reaction of high purity elemental thallium, lead and tellurium. Tl4PbTe3 thin films were prepared on well cleaned glass and silicon (100) substrates by electron beam evaporation. X-ray diffraction studies revealed that the films with low thickness were amorphous and the crystallinity increased with increasing film thickness. The thicker films were polycrystalline in nature and exhibited single phase structure. The composition of the chemical constituents present in the deposited Tl4PbTe3 thin films with different thicknesses was determined using energy dispersive analysis of X-ray. Spectroscopic ellipsometry was employed to determine the film thickness and optical constants. A two layer model was used to describe the experimental ellipsometric data. The refractive index and extinction coefficient were sensitive to the film thickness and increased with increasing the film thickness. The optical transmittance and reflectance spectra were dependent strongly on film thickness. The optical band gap decreased with the increase of thickness of the film.
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References
H Murakami, R Aoki and K Sakai Thin Solid Films 343-344 127 (1999)
I Hase and T Yanagisawa Physica C 445-448 61 (2006)
H Wang, A Charoenphakdee, K Kurosaki, S Yamanaka and G J Snyder Phys. Rev. B 83 024303 (2011)
A Kosuga, K Kurosaki, H Muta and S Yamanaka J. Appl. Phys. 99 063705 (2006)
S Sarmah and A Kumar Indian J. Phys. 84 1211 (2010); S Sarmah and A Kumar Indian J. Phys. 85 713 (2011)
K Tetsuya, G Q Guan and Y Akira Chem. Phys. Lett. 371 563 (2003)
R R Pawar, R A Bhavsar and S G Sonawane Indian J. Phys. 86 871 (2012)
S Mathew and K P V Kumar Bull. Mater. Sci. 17 235 (1994)
R Das and S Ray Indian J. Phys. 86 23 (2012)
S H Mohamed J. Alloy. Compd. 510 119 (2012)
S H Mohamed and Z H Dughaish Phil. Mag. 92 1212 (2012)
F Oudrhiri-Hassani, L Presmanes, A Barnabe and P Tailhades Appl. Surf. Sci. 254 5796 (2008)
S H Mohamed and S A Ahmed Eur. Phys. J. Appl. Phys. 44 137 (2008)
S H Mohamed Phil. Mag. 91 3598 (2011)
X Cao et al. J. Non-Cryst. Solids 354 2397 (2008)
S H Mohamed, M El-Hagary and S Althoyaib J. Alloy. Compd. 537 291 (2012)
S H Mohamed, M El-Hagary and A S Radwan Indian J. Phys. 87 223 (2013)
Y Jiang and N Bahlawane J. Alloys Compd. 485 L52 (2009)
Y L Jeyachandran, B Karunagaran, S K Narayandass and D Mangalaraj Mater. Sci. Eng. A 458 361 (2007)
B D Cullity Elements of X-ray Diffraction, 2nd edn (MA: Addison-Wesley Reading) p 102 (1979)
C M Herzinger, B Johs, W A McGahan, J A Woollam and W Paulson J. Appl. Phys. 83 3323 (1998)
R A Synowicki Thin Solid Films 313–314 394 (1998)
V Gupta and A Mansingh J. Appl. Phys. 80 1063 (1996)
N Revathi, P Prathap and K T R Reddy Solid State Sci. 11 1288 (2009)
M S Selim, M E Gouda, M G El-Shaarawy, A M Salem and W A Abd El-Ghany Thin Solid Films 527 164 (2013)
D Singh, S Kumar, R Thangaraj and T S Sathiaraj Physica B 408 119 (2013)
S H Mohamed and M Raaif Surf. Coat. Technol. 205 525 (2010)
S Agilan, D Mangalaraj, S K Narayandass and G M Rao Physica B 365 93 (2005)
C G Granqvist Handbook of Inorganic Electrochromic Materials (Netherlands: Elsevier Science B.V.) p 141 (1995)
D Pathinettam Padiyan, A Marikani and K R Murali Physica B 357 485 (2005)
Acknowledgments
This work is supported by Deanship of Scientific Research at Qassim Universiy—Saudi Arabia under contract no. 1620.
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Dughaish, Z.H., Mohamed, S.H. Evaluation of optical constants of Tl4PbTe3 thin films with different thicknesses. Indian J Phys 87, 741–746 (2013). https://doi.org/10.1007/s12648-013-0308-2
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DOI: https://doi.org/10.1007/s12648-013-0308-2