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Concentration sensor with multilayer thin film-coupled surface plasmon resonance

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Abstract

A concentration sensor based on silver (Ag)/silica (SiO2)/zirconium anhydride (ZrO2) multilayer structure is proposed. Two dominant dips can be observed in the reflection spectrum, which correspond to different sensing methods. Firstly, it is demonstrated that the coupling between the surface plasmon polariton (SPP) mode and a planar waveguide mode (WGM) leads to the Fano resonance (FR). The induced bonding hybridized modes have ultra-narrow full wave at half maximum (FWHM) as well as ultra-high quality factors (Q). We can achieve a theoretical value of the refractive index sensitivity 167 times higher than conventional surface plasmon resonance (SPR) sensors with a single metal layer. Secondly, the waveguide coupling mode was examined by measuring angular spectra. A deep and sharp waveguide coupling dip was obtained. The experimental results show that with an increase in the concentration of the fill dielectric material in the surface of the system, the resonance dip exhibits a remarkable red shift, and the measured angular sensitivity is 98.04°/RIU.

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Authors and Affiliations

  1. Department of Electronics Engineering, Nanjing Xiaozhuang University, Nanjing, 211171, China

    Sen Bao  (鲍森) & Hong-jing Li  (李洪敬)

  2. Jiangsu Collaborative Innovation Center on Atmospheric Environment and Equipment Technology (CICAEET), Nanjing University of Information Science &Technology, Nanjing, 210044, China

    Gai-ge Zheng  (郑改革)

Authors
  1. Sen Bao  (鲍森)
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  2. Hong-jing Li  (李洪敬)
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  3. Gai-ge Zheng  (郑改革)
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Corresponding author

Correspondence to Gai-ge Zheng  (郑改革).

Additional information

This work has been supported by the National Science Foundation of China (No.41675154), and the Natural Science Foundation of Jiangsu Province (No.BK20191396).

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Bao, S., Li, Hj. & Zheng, Gg. Concentration sensor with multilayer thin film-coupled surface plasmon resonance. Optoelectron. Lett. 17, 289–293 (2021). https://doi.org/10.1007/s11801-021-0088-4

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  • DOI: https://doi.org/10.1007/s11801-021-0088-4

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