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Effects of Microstructure and Loading on Fracture of Sn-3.8Ag-0.7Cu Joints on Cu Substrates with ENIG Surface Finish

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Abstract

When dropped, electronic packages often undergo failure by propagation of an interfacial crack in solder joints under a combination of tensile and shear loading. Hence, it is crucial to understand and predict the fracture behavior of solder joints under mixed-mode high-rate loading conditions. In this work, the effects of the loading conditions (strain rate and loading angle) and microstructure [interfacial intermetallic compound (IMC) morphology and solder yield strength] on the mixed-mode fracture toughness of Sn-3.8 wt.%Ag-0.7 wt.%Cu solder joints sandwiched between two Cu substrates with electroless nickel immersion gold (ENIG) metallization have been studied, and compared with the fracture behavior of joints attached to bare Cu. Irrespective of the surface finish, the fracture toughness of the solder joints decreased monotonically with strain rate and mode-mixity, both resulting in increased fracture proportion through the interfacial IMC layer. Furthermore, the proportion of crack propagation through the interfacial IMC layer increased with increase in the thickness and the roughness of the interfacial IMC layer and the yield strength of the solder, resulting in a decrease in the fracture toughness of the joint. However, under most conditions, solder joints with ENIG finish showed higher resistance to fracture than joints attached directly to Cu substrates without ENIG metallization. Based on the experimental observations, a fracture mechanism map is constructed correlating the yield strength of the solder, the morphology and thickness of the interfacial IMC, and the fracture mechanisms as well as the fracture toughness values for different solder joints under mode I loading.

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Acknowledgements

This research was supported by National Science Foundation (NSF) Grant DMR-0939392 and Semiconductor Research Corporation (SRC) Contracts 2008-KJ-1855 and 2005-KC-1292 (Task 1292.088). Partial support from Strategic Research and Development Program (SERDP) Contract # W912HQ-10-C-0041 is also gratefully acknowledged.

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Authors and Affiliations

  1. School of Mechanical and Materials Engineering, Washington State University, Pullman, WA, 99164, USA

    Z. Huang & I. Dutta

  2. Department of Materials Engineering, Indian Institute of Science, Bangalore, 560012, India

    P. Kumar

  3. Assembly Technology Development, Intel Corp., 5000 W. Chandler Blvd, Chandler, AZ, 85226, USA

    R. Sidhu, M. Renavikar & R. Mahajan

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  1. Z. Huang
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  2. P. Kumar
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  3. I. Dutta
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  4. R. Sidhu
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  5. M. Renavikar
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  6. R. Mahajan
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Correspondence to I. Dutta.

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Huang, Z., Kumar, P., Dutta, I. et al. Effects of Microstructure and Loading on Fracture of Sn-3.8Ag-0.7Cu Joints on Cu Substrates with ENIG Surface Finish. J. Electron. Mater. 43, 4485–4496 (2014). https://doi.org/10.1007/s11664-014-3441-6

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  • DOI: https://doi.org/10.1007/s11664-014-3441-6

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