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Interfacial Reactions and Joint Strengths of Sn-xZn Solders with Immersion Ag UBM

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The solder joint microstructures of immersion Ag with Sn-xZn (x = 0 wt.%, 1 wt.%, 5 wt.%, and 9 wt.%) solders were analyzed and correlated with their drop impact reliability. Addition of 1 wt.% Zn to Sn did not change the interface microstructure and was only marginally effective. In comparison, the addition of 5 wt.% or 9 wt.% Zn formed layers of AgZn3/Ag5Zn8 at the solder joint interface, which increased drop reliability significantly. Under extensive aging, Ag-Zn intermetallic compounds (IMCs) transformed into Cu5Zn8 and Ag3Sn, and the drop impact resistance at the solder joints deteriorated up to a point. The beneficial role of Zn on immersion Ag pads was ascribed to the formation of Ag-Zn IMC layers, which were fairly resistant to the drop impact, and to the suppression of the brittle Cu6Sn5 phase at the joint interface.

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References

  1. G.O. Mallory and J.B. Hadju, American Electroplater and Surface Finishers Society (Orlando, FL, 1990).

  2. R. Aschenbrenner, A. Ostmann, U. Beutler, J. Simon, and H. Reichl, IEEE Trans. CPMT B 18, 334 (1995).

    CAS  Google Scholar 

  3. T.C. Chiu, K. Zeng, R. Strierman, D. Edwards, and K. Ano, Proceedings of the Electronic Component and Technology Conference (2004), p. 1256.

  4. Z. Mei, M. Ahmad, M. Hu, and G. Ramakrishna, Proceedings of the Electronic Component and Technology Conference (2005), p. 415.

  5. K. Zeng, R. Stierman, T.C. Chiu, and D. Edwards, J. Appl. Phys. 97, 024508 (2005).

    Article  ADS  Google Scholar 

  6. Y.C. Sohn, J. Yu, S.K. Kang, D.Y. Shih, and T.Y. Lee, J. Mater. Res. 19, 2428 (2004).

    Article  CAS  ADS  Google Scholar 

  7. Y.C. Sohn and J. Yu, J. Mater. Res. 20, 1931 (2005).

    Article  CAS  ADS  Google Scholar 

  8. J. Yu, Y.C. Sohn, J.Y. Kim, Y.K. Jee, and Y.H. Ko, Proceedings of the International Conference on Electronics Packaging (2006), p. 271.

  9. D. Goyal, T. Lane, P. Kinzie, C. Panichas, K.M. Chong, and O. Villalobos, Proceedings of the Electronic Component and Technology Conference (2002), p. 732.

  10. J.L. Fang and D.K. Chan, Circ. World 33, 43 (2007).

    Article  CAS  Google Scholar 

  11. M. Arra, D. Shangguan, D. Xie, J. Sundelin, T. Lepisto, and E. Ristolainen, J. Electron. Mater. 33, 977 (2004).

    Article  CAS  ADS  Google Scholar 

  12. J.W. Yoon, J.H. Lim, H.J. Lee, J. Joo, S.B. Jung, and W.C. Moon, J. Mater. Res. 21, 3196 (2006).

    Article  CAS  ADS  Google Scholar 

  13. T.H. Chuang, S.F. Yen, and H.M. Wu, J. Electron. Mater. 35, 310 (2006).

    Article  CAS  ADS  Google Scholar 

  14. J.W. Yoon and S.B. Jung, J. Alloys Compd. 458, 200 (2008).

    Article  CAS  Google Scholar 

  15. H.J. Lin and T.H. Chuang, J. Electron. Mater. 35, 154 (2006).

    Article  CAS  ADS  Google Scholar 

  16. H.F. Zou and Z.F. Zhang, J. Electron. Mater. 37, 1119 (2008).

    Article  CAS  MathSciNet  ADS  Google Scholar 

  17. J.W. Jang, A. De Silva, J.K. Lin, and D. Frear, Proceedings of the Electronic Component and Technology Conference (2003), p. 680.

  18. K. Nogita, Intermetallics 18, 145 (2010).

    Article  CAS  Google Scholar 

  19. Y.K. Jee, Y.H. Ko, and J. Yu, J. Mater. Res. 22, 1879 (2007).

    Article  CAS  ADS  Google Scholar 

  20. F.J. Wang, Z.S. Yu, and K. Qi, J. Alloys Compd. 438, 110 (2007).

    Article  CAS  Google Scholar 

  21. J.M. Song and K.L. Lin, J. Mater. Res. 19, 2719 (2004).

    Article  CAS  ADS  Google Scholar 

  22. J.M. Song, P.C. Liu, C.L. Shih, and K.L. Lin, J. Electron. Mater. 34, 1249 (2005).

    Article  CAS  ADS  Google Scholar 

  23. M. Date, K.N. Tu, T. Shoji, M. Fujiyoshi, and K. Sato, J. Mater. Res. 19, 2887 (2004).

    Article  CAS  ADS  Google Scholar 

  24. L. Kaufman and H. Bernstein, Computer Calculation of Phase Diagrams (New York: Academic, 1970).

    Google Scholar 

  25. B.J. Lee, N.M. Hwang, and H.M. Lee, Acta Mater. 45, 1867 (1997).

    Article  CAS  Google Scholar 

Download references

Acknowledgement

This work was supported by the office of KAIST EEWS Initiative (EEWS: Energy, Environment, Water, and Sustainability) (Grant No. EEWS0917).

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Correspondence to Jin Yu.

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Jee, Y.K., Yu, J. Interfacial Reactions and Joint Strengths of Sn-xZn Solders with Immersion Ag UBM. J. Electron. Mater. 39, 2286–2291 (2010). https://doi.org/10.1007/s11664-010-1308-z

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  • DOI: https://doi.org/10.1007/s11664-010-1308-z

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