Comparative resistivity measurements have been performed on differently prepared κ-(ET)2Cu[N(CN)2]Br single crystals. While the Tc values and their shifts under hydrostatic pressure are found to be sample independent, the resistivity profiles, especially around the resistivity hump at 90 K and the low-temperature ρ ∝ T2 behavior, show striking sample-to-sample variations. In the absence of significant differences in the crystals’ structural parameters and chemical compositions, as proved by high-resolution X-ray and electron-probe-microanalysis studies, these results indicate that real structure phenomena, i.e. disorder and/or defects, strongly affect the inelastic scattering in these molecular conductors.
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Lang, M., Strack, C., Akinci, C. et al. Resistivity Studies on Different Variants of κ-(BEDT-TTF)2Cu[N(CN)2]Br: Evidence for Disorder and /or Defect-Induced Inelastic Scattering Contributions. J Low Temp Phys 142, 191–197 (2006). https://doi.org/10.1007/s10909-006-9018-x
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DOI: https://doi.org/10.1007/s10909-006-9018-x