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Effect of stress on ferroelectric properties in flexible BiFe0.97Cr0.03O3/BiFe1−xMnxO3 composite thin films

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Abstract

Wearable devices and flexible electronics have promoted the development of flexible thin film materials. Flexible films with excellent performance and adapted to the operating conditions of flexible electronic devices are required. Here, the flexible BiFe0.97Cr0.03O3/BiFe1−xMnxO3 (x = 0.05–0.09) ferroelectric thin films were successfully prepared on LaNiO3/fluorophlogopite (F-Mica) by the sol–gel method. The flexible BiFe0.97Cr0.03O3/BiFe0.93Mn0.07O3 (BFC0.03O/BFM0.07O) sample shows a best ferroelectricity with a real residual polarization value of 106.59 µC/cm2 was obtained from the Positive Up Negative Down (PUND). The flexible sample maintains true ferroelectric performance at different frequencies and shows excellent bending fatigue resistance after mechanical bending with 10000 cycles. The residual stress generated by mechanical bending increases the polarization of the flexible sample while maintaining the true ferroelectric polarization. The larger residual stress results in the enlargement of the defect. This provides an interesting approach to the ferroelectric regulation of flexible thin films. The flexible BiFe0.97Cr0.03O3/BiFe1−xMnxO3 thin films with excellent ferroelectricity and bending fatigue resistance are promising for the applications in high temperature flexible electronic components and sensors.

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All data generated or analysed during this study are included in this published article [and its supplementary information files].

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Funding

This work was supported by the National Natural Science Foundation of China (52002235, 52002236). It was also partially supported by Doctoral Scientific Research Startup Foundation of Shaanxi University of Science and Technology (No. 2019BJ-30).

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Author notes

  1. Di Ao and Shuxian Liu have contributed equally to this work.

Authors and Affiliations

  1. School of Electronic Information and Artificial Intelligence, Shaanxi University of Science and Technology, Xi’an, 710021, China

    Shuxian Liu, Wenlong Liu, Di Li, Jin Zong, Qibin Yuan & Dinghan Liu

  2. School of Materials Science and Engineering, Shaanxi University of Science and Technology, Xi’an, 710021, China

    Di Ao, Guoqiang Tan & Ao Xia

Authors
  1. Di Ao
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  2. Shuxian Liu
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  3. Wenlong Liu
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Contributions

All authors contributed to the study conception and design. Material preparation, data collection, and analysis were performed by DA and SL. Experimental program planning and experimental guidance were performed by WL and GT. Software technical services were supported by DL, JZ, QY and DL. The manuscript was polished by AX. The first draft of the manuscript was written by DA, SL, and WL. All authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.

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Correspondence to Wenlong Liu or Guoqiang Tan.

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Ao, D., Liu, S., Liu, W. et al. Effect of stress on ferroelectric properties in flexible BiFe0.97Cr0.03O3/BiFe1−xMnxO3 composite thin films. J Mater Sci: Mater Electron 35, 247 (2024). https://doi.org/10.1007/s10854-024-12004-w

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