Correction to: Revived BBFTO double perovskite with improved dielectric properties for some possible device applications

Correction to: J. Mater Sci: Mater Electron (2023) 34:1019 https://doi.org/10.1007/s10854-023-10434-6

The original version of this article was published with few errors in the Rietveld refinement part of XRD profile. The investigated sample was identified with dual phase such as tetragonal (space group = P4mm) and monoclinic (space group = P 121/C1). The percentage of matching of tetragonal phase with experimental XRD spectra was found as 73.6% with lattice parameters a = b = 4.004 Å, c = 3.997 Å, while that of the monoclinic phase was 26.4%. The reliability parameters obtained through the Rietveld refinement are χ² = 1.369, R_wp (%) = 7.701, R_b (%) = 6.072, and R_exp (%) = 5.622. The corrected refined XRD profile using Rietveld refinement technique (MATCH Software) and the details of the parameters obtained through the refinement are displayed in Fig. 1, Tables 1, and 2, respectively.

Fig. 1

The corrected XRD profile of the investigated sample

Table 1 The detailed parameters obtained through Rietveld refinement of the investigated sample

Table 2 Intensity profile of the investigated sample

These have been corrected by publishing this correction article.