Correction to: J Mater Sci: Mater Electron 33, 23555–23565 (2022) https://doi.org/10.1007/s10854-022-09115-7


This correction article is to provide clarifications to the readers of the original article [1] on the data presented therein. The samples are not thin films but flat thick disks of thickness 0.20 mm. The samples were free standing on a sample holder. In addition, samples were uniform in composition. The absorption coefficient was calculated from the absorbance using a = 2.303A/d, where A is the absorbance and d is the thickness. The observed peaks are not from interference, but correspond to absorption peaks characteristic of NiFe2O4, as given [2, 3].