Abstract
A hot filament chemical vapor deposition is an attractive technique to deposit carbon films of different applications. In this technique, it is also feasible to study the influence of chamber pressure in the deposition of carbon films. In the deposition chamber, having dissociated from the methane precursor, gaseous carbon atoms first convert into the graphite state atoms and then into the diamond state atoms. An increase in the chamber pressure changes the morphology and structure of the deposited carbon films. The deposited carbon films increase the growth rate by increasing the chamber pressure from 3.3 to 8.6 kPa. The rate of converting gaseous carbon atoms into diamond atoms also increases. At 11.3 and 14 kPa chamber pressure, gaseous carbon atoms convert into graphite state atoms at a high rate. The gas activation and gas collision processes vary broadly at varying chamber pressure. The morphology and structure of carbon films got deposited at different growth rates. The dissociation of molecular hydrogen into atomic hydrogen varies by varying the chamber pressure. The etching of photons (released from the hot filaments) into the dash- and golf-stick-shaped energy bits is from the atomic hydrogen. Thus, bits of differently shaped energy result. Gaseous carbon atoms convert into graphite and diamond state atoms depending on the set value of chamber pressure. Graphite state atoms bind under the same involved energy bits while conversion, which is not the case when the diamond state atoms bind. Carbon films in different phases have emerged with many applications: cutting tools, field emitter devices, heat sinks for electronic equipment, electrode materials, biological sensors, infrared imaging technology, etc. Such applications are well-suit to carbon-based materials compared to other materials. So, the study sets a new trend in depositing, characterizing, and analyzing carbon films.
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Acknowledgements
Mubarak Ali expresses sincere gratitude to The Scientific and Technological Research Council of Türkiye (TÜBİTAK), the letter ref. # B.02.1.TBT.0.06.01-216.01-677-6045 for the postdoc award in the year 2010. Mubarak Ali thanks Ex-postdoc Advisor Professor Dr. Mustafa Ürgen retired from Istanbul Technical University. Permission to publish the article without Advisor’s name granted. He also thanks Mr. Talat ALPAK (ITU, Istanbul) for helping in the field-emission scanning microscope. Mubarak Ali appreciates the kind support of Professor Dr. Kürşat KAZMANLI, Dr. Erdem Arpat, Dr. Semih ÖNCEL, Dr. Manawer, Dr. Nagihan Sezgin, Dr. Sinan Akkaya, and others while staying at ITU.
Funding
The Scientific and Technological Research Council of Türkiye (TÜBİTAK), the letter ref. # B.02.1.TBT.0.06.01-216.01-677-6045.
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Ali, M. Etching of photon energy into binding energy in depositing carbon films at different chamber pressures. J Mater Sci: Mater Electron 34, 1209 (2023). https://doi.org/10.1007/s10854-023-10604-6
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DOI: https://doi.org/10.1007/s10854-023-10604-6