Abstract
The temperature dependence of the electrical parameters of the Au/α-Al2O3/p-Si/Al heterojunction diode and the variation of these parameters with radiation were investigated. It has been determined that the lnI–V curves of the diode have non-linear plots and this is due to the inhomogeneity in the potential barrier. The ideality factor (n), barrier height (Φb) and series resistance (Rs) values of the diode were calculated depending on the temperature. It was determined that n and Rs values decrease and Φb values increase with the increase in temperature. The voltage coefficients and standard deviation values are calculated using the [(1/n) − 1] − 1/2kT and Φb − 1/2kT graphs of heterojunction diode. The value of Richardson constant was calculated as A* = 7.64 A/K2 cm2 using conventional Richardson plot of ln(I0/T2) against 1/T. In addition, the effects of different X-ray irradiation doses on the I–V characteristics of Au/Al2O3/p-Si/Al heterojunction were examined.
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The datasets generated during and/or analyzed during the current study are not publicly available due [reason(s) why data are not publıc] but are available from the corresponding author on reasonable request.].
References
A. Türüt, On current-voltage and capacitance-voltage characteristics of metal-semiconductor contacts. Turk. J. Phys. 44, 302–347 (2020)
Z. Çaldıran, L.B. Taşyürek, The role of molybdenum trioxide in the change of electrical properties of Cr/MoO3/n-Si heterojunction and electrical characterization of this device depending on temperature. Sens. Act. Phys. 328, 112765 (2021)
İ Gümüş, Ö. Metin, M. Sevim, Ş Aydoğan, Analysis on the temperature dependent electrical properties of Cr/Grapheneoxide-Fe3O4 nanocomposites/n-Si heterojunction device. Diam. Relat. Mat. 108, 107933 (2020)
E.H. Rhoderick, R.H. Williams, Metal semiconductor contacts, 2nd edn. (Oxford University Press, 1988)
H. Panitchakan, P. Limsuwan, Characterization of aluminum oxide films deposited on Al2O3-TiC by RF diode sputtering. Proced. Engine. 32, 902–908 (2012)
Ç.Ş Güçlü, A.F. Özdemir, A. Karabulut, A. Kökçe, Ş Altındal, Investigation of temperature dependent negative capacitance in the forward bias C-V characteristics of (Au/Ti)/Al2O3/n-GaAs Schottky barrier diodes (SBDs). Mat. Sci. Semicond. Proces. 89, 26–31 (2019)
E.O. Filatova, A.S. Konashuk, Interpretation of the changing the band gap of Al2O3 depending on its crystalline form: connection with different local symmetries. J. Phys. Chem. C. 119, 20755–20761 (2015)
G. Qianqian, L. Fei, T. Qiulin, Z. Tianhao, X. Jijun, Z. Wendong, Al2O3-based a-IGZO Schottky diodes for temperature sensing. Sensors 19(2), 224 (2019)
K. Bhatt, S. Kumar, C.C. Tripathi, Highly sensitive Al/Al2O3/Ag MIM diode for energy harvesting applications. AEU Internat. J. Elect. Commun. 111, 152925 (2019)
J.-A. Jeong, H.-K. Kim, Al2O3/Ag/Al2O3 multilayer thin film passivation prepared by plasma damage-free linear facing target sputtering for organic light emitting diodes. Th. Sol. Film. 547, 63–67 (2013)
Y. Yu, I. Akihiko, T. Rong, G. Takashi, Orientation control of alpha-Al2O3 films prepared by laser chemical vapor deposition using a diode laser. J. Ceram. Soc. Jap. 118(1377), 366–369 (2010)
R. Benabderrahmane, M. Kanoun, N. Bruyant, H. Achard, C. Baraduc, A. Bsiesy, Electrical study of NiFe/Al2O3/Si tunnel diodes for magnetic memories. Internat. Confer. Mıcroelect. ICM (2008). https://doi.org/10.1109/ICM.2008.5393832
S. Okuyama, K. Umemoto, K. Okuyama, S. Ohshima, K. Matsushita, Pd/Ni–Al2O3–Al tunnel diode as high-concentration-hydrogen gas sensor. Jpn. J. Appl. Phys. 36, 1228 (1997)
S. Shi, Y. Wang, X. Wu, Z. Yang, X. Li, J. Yang, F. CaO, Improving the barrier inhomogeneity of 4H-SiC Schottky diodes by inserting Al2O3 interface layer. Sol. Stat. Elect. 180, 107992 (2021)
M.S.P. Reddy, J.-H. Lee, J.-S. Jang, Electrical characteristics of TMAH-surface treated Ni/Au/Al2O3/GaN MIS Schottky structures. Electron. Mater. Lett. 10(2), 411–416 (2014)
A.R. Deniz, Z. Çaldıran, Heterojunction diode application of yttrium ıron oxide (Y3Fe5O12). J. Mater. Sci: Mater. Electron. 33(8), 173–182 (2022)
R.C.R. Santos, E. Longhinotti, V.N. Freire, R.B. Reimberg, E.W.S. Caetano, Elucidating the high-κ insulator α-Al2O3 direct/indirect energy band gap type through density functional theory computations. Chem. Phys. Lett. 637, 172–176 (2015)
J. Osvald, L. Hrubcin, B. Zatko, Temperature dependence of electrical behaviour of inhomogeneous Ni/Au/ 4H–SiC Schottky diodes. Mat. Sci. Semicon. Proces. 140, 106413 (2022)
S. Duman, B. Gürbulak, M. Şata, Analysis of temperature dependent current-voltage characteristics of Sn/p-GaTe/In Schottky diode. Optc. Mat. 125, 112138 (2022)
A. Türüt, A. Karabulut, H. Efeoğlu, Effect of the Al2O3 interfacial layer thickness on the measurement temperature-induced I–V characteristics in Au/Ti/Al2O3/n-GaAs structures. J. Mater. Sci: Mater. Electron. 32, 22680–22688 (2021)
Z. Çaldıran, Modification of Schottky barrier height using an inorganic compound interface layer for various contact metals in the metal/p-Si device structure. J. Alloy. Comp. 865, 158856 (2021)
A.R. Deniz, A.İ Taş, Z. Çaldıran, Ü. İncekara, M. Biber, Ş Aydoğan, A. Türüt, Effects of PEDOT: PSS and crystal violet interface layers on current-voltage performance of Schottky barrier diodes as a function of temperature and variation of diode capacitance with frequency. Cur. App. Phiys. 39, 173–182 (2022)
A. Sarılmaz, F. Ozel, A. Karabulut, İ Orak, M.A. Şahinkaya, The effects of temperature and frequency changes on the electrical characteristics of hot-injected Cu2MnSnS4 chalcogenide-based heterojunction. Physc. B: Phys. Cond. Mat. 580, 411821 (2020)
H. Ezgin, E. Demir, A. Acar, M. Özer, Investigation of temperature-dependent electrical parameters in a Schottky barrier diode with multi-walled carbon nanotube (MWCNT) interface. Mat. Sci. Semicon. Proces. 147, 106672 (2022)
Ö. Sevgili, İ Orak, The investigation of current condition mechanism of Al/Y2O3/p-Si Schottky barrier diodes in wide range temperature and illuminate. Microelect. Reliabil. 117, 114040 (2021)
T. Güzel, A.K. Bilgili, M. Özer, Investigation of inhomogeneous barrier height for Au/n-type 6HSiC Schottky diodes in a wide temperature range. Superlat. Microstruc. 124, 30–40 (2018)
A.A. Kumar, L.D. Rao, V.R. Reddy, C.-J. Choi, Analysis of electrical characteristics of Er/p-InP Schottky diode at high temperature range. Cur. Appl. Phys. 13, 975–980 (2013)
S. Mahato, J. Puigdollers, Temperature dependent current-voltage characteristics of Au/n-Si Schottky barrier diodes and the effect of transition metal oxides as an interface layer. Phys. B Phys. Cond. Mat. 530, 327–335 (2018)
S. Oussalah, W. Filali, E. Garoudja, B. Zatout, F. Lekoui, R. Amrani, N. Sengouga, M. Henini, Analysis of I–V-T characteristics of Be-doped AlGaAs Schottky diodes grown on (100) GaAs substrates by molecular beam epitaxy. Microelect. Jour. 122, 105409 (2022)
N. Ozawa, T. Makino, H. Kato, M. Ogura, Y. Kato, D. Takeuchi, H. Okushi, S. Yamasaki, Temperature dependence of electrical characteristics for diamond Schottkypn diode in forward bias. Dia. Relat. Mat. 85, 4–52 (2018)
A. Dey, R. Jana, J. Dhar, P. Das, P.P. Ray, Gaussian distribution of inhomogeneous barrier height of Al/ZnS/ITO Schottky barrier diodes. Mat. Tod. Proce. 5, 9958–9964 (2018)
A.R. Kumar, A.S. Kumar, K.K. Sharma, S. Chand, Analysis of anomalous transport mechanism across the interface of Ag/p-Si Schottky diode in wide temperature range. Superlat. Microstr. 128, 373–381 (2019)
M. Gark, A. Kumar, H. Sun, C.-H. Liao, X. Li, R. Singh, Temperature dependent electrical studies on Cu/AlGaN/GaN Schottky barrier diodes with its microstructural characterization. J. Alloy. Comp. 806, 852–857 (2019)
P.R. Reddy, V. Janardhanam, K.-H. Shim, V. Rajagopal Reddy, S.-N. Lee, S.-J. Park, C.-J. Choi, Temperature-dependent Schottky barrier parameters of Ni/Au on n-type (001) β-Ga2O3 Schottky barrier diode. Vacuum 171, 109012 (2020)
Z. Khurelbaatar, M.-S. Kang, K.-H. Shim, H.-J. Yun, J. Lee, H. Hong, S.-Y. Chang, S.-N. Lee, C.-J. Choi, Temperature dependent currentevoltage characteristics of Au/n-type Ge Schottky barrier diodes with graphene interlayer. J. Alloy. Comp. 650, 658–663 (2015)
A. Venter, D.M. Murape, J.R. Botha, F.D. Auret, Transport characteristics of Pd Schottky barrier diodes on epitaxial n-GaSb as determined from temperature dependent current–voltage measurements. Th. Sol. Film. 574, 32–37 (2015)
M. Gülnahar, Temperature dependence of current-and capacitance–voltage characteristics of an Au/4H-SiC Schottky diode. Superlat. Microstruc. 76, 394–412 (2014)
Ö.F. Yüksel, N. Tuğluoğlu, B. Gülveren, H. Şafak, B. Kuş, Electrical properties of Au/perylene-monoimide/p-Si Schottky diode. J. Alloy. Comp. 577, 30–36 (2013)
S. Krishnan, G. Sanjeev, M. Pattabi, Electron irradiation effects on the Schottky diode characteristics of p-Si. Nuc. Inst. Meth. Phys. Researc. 266, 621–624 (2008)
Z. Çaldıran, A.R. Deniz, Y. Şahin, Ö. Metin, K. Meral, Ş Aydoğan, The electrical characteristic of the Fe3O4/Si junctions. J. Alloy. Comp. 552, 437–442 (2013)
K. Arshak, O. Karastyrska, Thick film oxide diode structures for personal dosimetry application. Sensor. Act. 113, 319–323 (2004)
M.A. Salari, M. Sağlam, B. Güzeldir, The protection from the effects of gamma rays of metal-semiconductor diodes by means of ZnO thin interface layer. Rad. Phys. Chem. 165, 108416 (2019)
V. Gnatyuk, In/CdTe/Au p–n junction-diode X/γ-ray detectors formed by frontside laser irradiation doping. Nuc. Inst. Meth. Phys. Researc. 1029, 166397 (2022)
M.A. Salari, M. Sağlam, A. Baltakesmez, B. Güzeldir, Effect of electron radiation on electrical parameters of Zn/n-Si/Au–Sb and Zn/ZnO/n-Si/Au–Sb diodes. J. Radio. Nuc. Chem. 319, 667–668 (2019)
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This study was financed from Hakkari University Scientific Research Projects budget numbered “FM22BAP2.”
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In this study, fabrication process of the diode, performing electrical measurements, and analyzing these measurements were carried out by Assistance Prof. Dr. ARD, Assistance Prof. Dr. ZÇ and Dr. LBT.
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Deniz, A.R., Çaldıran, Z. & Taşyürek, L.B. Electrical characteristics of Al2O3/p-Si heterojunction diode and effects of radiation on the electrical properties of this diode. J Mater Sci: Mater Electron 33, 26954–26965 (2022). https://doi.org/10.1007/s10854-022-09359-3
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DOI: https://doi.org/10.1007/s10854-022-09359-3