Correction to: Journal of Materials Science: Materials in Electronics (2022) https://doi.org/10.1007/s10854-022-07705-z

Figure 3 in the original article has been found to be erroneous after checking the EDS raw data. Provided below is the correct version of Fig. 3. This correction does not affect the conclusion.

Fig. 3
figure 3

a EDS spectrum, the inset standing for the SEM image of β-SiCw@SiO2, b–c the corresponding element mapping for β-SiCw@SiO2