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Correction to: Journal of Materials Science: Materials in Electronics (2021) https://doi.org/10.1007/s10854-021-06332-4
The original version of this article unfortunately contained a mistake. The Eqs. (11) and (12) in the paper [1] have been published with errors. The correct version of Eqs. 11 and 12 are below
and
Note that the errors were only typographical, calculations and discussions in the article are unaffected, and the conclusions remain unchanged.
Reference
P.H.T. Silva, M.A.S. Silva, A.S.B. Sombra, P.B.A. Fechine, Dielectric properties of bismuth layer structured ferroelectric Bi3R2Ti3FeO15 (R = Bi, Gd, and Nd) at microwave and radiofrequency. J Mater Sci: Mater Electron (2021). https://doi.org/10.1007/s10854-021-06332-4
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Silva, P.H.T., Silva, M.A.S., Sombra, A.S.B. et al. Correction to: Dielectric properties of bismuth layer-structured ferroelectric Bi3R2Ti3FeO15 (R = Bi, Gd, and Nd) at microwave and radiofrequency. J Mater Sci: Mater Electron 32, 18644–18645 (2021). https://doi.org/10.1007/s10854-021-06411-6
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DOI: https://doi.org/10.1007/s10854-021-06411-6