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Improved microwave dielectric properties of Nd(Mg0.5Sn0.5)O3 ceramics with Ni2+ substituting

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Abstract

This study elucidates the microwave dielectric properties and microstructures of Nd(Mg0.5−xNixSn0.5)O3 ceramics with a view to their potential for microwave devices. The Nd(Mg0.5−xNixSn0.5)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the Nd(Mg0.43Ni0.07Sn0.5)O3 ceramics revealed no significant variation of phase with sintering temperatures. A dielectric constant (\( \varepsilon_{r} \)) of 19.3 and a quality factor (Q × f) of 93,400 GHz and a temperature coefficient of resonant frequency (\( \tau_{f} \)) of −66 ppm/ °C were obtained for Nd(Mg0.43Ni0.07Sn0.5)O3 ceramics that were sintered at 1,550 °C for 4 h.

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Acknowledgments

The authors would like to thank the National Science Council in Taiwan, for financially supporting this research under Contract No. NSC 100-2622-E-262-007.

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Authors and Affiliations

  1. Department of Electrical Engineering, Lunghwa University of Science and Technology, Gueishan Shiang, Taoyuan County, Taiwan

    Yih-Chien Chen & Shi-Li Yao

  2. Department of Electronic Engineering, Lunghwa University of Science and Technology, Gueishan Shiang, Taoyuan County, Taiwan

    Yung-Yu Chen

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  1. Yih-Chien Chen
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  2. Yung-Yu Chen
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Correspondence to Yih-Chien Chen.

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Chen, YC., Chen, YY. & Yao, SL. Improved microwave dielectric properties of Nd(Mg0.5Sn0.5)O3 ceramics with Ni2+ substituting. J Mater Sci: Mater Electron 24, 1150–1157 (2013). https://doi.org/10.1007/s10854-012-0898-z

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