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Journal of Electronic Testing

, Volume 29, Issue 6, pp 879–892 | Cite as

Multi-bit Sigma-Delta TDC Architecture with Improved Linearity

  • Satoshi Uemori
  • Masamichi Ishii
  • Haruo KobayashiEmail author
  • Daiki Hirabayashi
  • Yuta Arakawa
  • Yuta Doi
  • Osamu Kobayashi
  • Tatsuji Matsuura
  • Kiichi Niitsu
  • Yuji Yano
  • Tatsuhiro Gake
  • Takahiro J. Yamaguchi
  • Nobukazu Takai
Article

Abstract

This paper describes the architecture and principles of operation of sigma-delta ( ΣΔ) time-to-digital converters (TDC) for high-speed I/O interface circuit test applications. In particular, we describe multi-bit ΣΔ TDC architectures; they offer good accuracy with short testing time. However, mismatches among delay cells in delay lines degrade their linearity. Here we propose two methods to improve the overall TDC linearity: a data-weighted-average (DWA) algorithm, and a self-calibration method that measures delay values using a ring oscillator circuit. Our Matlab simulation results demonstrate the effectiveness of these approaches.

Keywords

Time-to-digital converter Time measurement Sigma-delta modulation Multi-bit Calibration High-speed I/O interface circuit testing 

Notes

Acknowledgment

We acknowledge comments from K. Sato, S. Kawauchi, F. Abe, K. Sakuma and K. Wilkinson.

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Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  • Satoshi Uemori
    • 1
  • Masamichi Ishii
    • 1
  • Haruo Kobayashi
    • 1
    Email author
  • Daiki Hirabayashi
    • 1
  • Yuta Arakawa
    • 1
  • Yuta Doi
    • 1
  • Osamu Kobayashi
    • 2
  • Tatsuji Matsuura
    • 1
  • Kiichi Niitsu
    • 3
  • Yuji Yano
    • 2
  • Tatsuhiro Gake
    • 2
  • Takahiro J. Yamaguchi
    • 1
  • Nobukazu Takai
    • 1
  1. 1.Division of Electronics and InformaticsGunma UniversityGunmaJapan
  2. 2.Semiconductor Technology Academic Research Center (STARC)YokohamaJapan
  3. 3.Department of Electrical Engineering and Computer Science, Graduate School of EngineeringNagoya UniversityNagoyaJapan

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