Skip to main content
SpringerLink
Log in

XPS Studies of Gd2Fe12Si2B Thin Films

  • Published:
Czechoslovak Journal of Physics Aims and scope

Abstract

Structural studies showed that the flash-evaporated Gd2Fe12Si2B thin films deposited onto the liquid nitrogen cooled glass substrates are amorphous and crystallize after an annealing at 770 K. Samples prepared onto non-cooled substrates are nanocrystalline. Results of the X-ray photoelectron spectroscopy (XPS) studies showed that the surface composition of the films is practically the same as the average volume composition. On the other hand, we have observed a drastic change in the shape of the XPS valence band after in situ annealing of the nanocrystalline films. This behavior could be explained by a structural transition and/or relaxation of the flash-evaporated thin films after annealing.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

Author information

Authors and Affiliations

  1. Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland Smardz@ifmpan.poznan.pl

    L. Smardz

  2. Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznań, Poland

    A. Kowalczyk & T. Toliński

  3. Department of Physics, A. Mickiewicz University, Umultowska 85, 61-614 Poznań, Poland

    I. Gościańska

Authors
  1. L. Smardz
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. Kowalczyk
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. T. Toliński
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. I. Gościańska
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Smardz, L., Kowalczyk, A., Toliński, T. et al. XPS Studies of Gd2Fe12Si2B Thin Films. Czech J Phys 54 (Suppl 4), 233–236 (2004). https://doi.org/10.1007/s10582-004-0071-x

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10582-004-0071-x

Keywords

Search

Navigation