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A calibration technique based on sub-stages’ weights of pipelined ADC

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Abstract

This paper describes an efficient background calibration technique for pipelined analog-to-digital converters (ADCs). This technique calibrate the interstage gain errors, capacitor mismatches and finite opamp open-loop gain by updating the weights of sub-stages that carry the information about these errors. A weight-based errors model is built to simplify calibration algorithm. The errors are merged into the weight of the corresponding stage. The first seven stages of every signal path are calibrated to achieve high resolution and eliminate errors. Two extra sub-stages are used in the calibration process to implement background calibration. The improved technique is used in a 14-bits 80 MS/s pipelined ADC. The results demonstrate that it can decrease errors, increase the effective number of bits by 2.04, and SFDR is 90.12 dB and ENOB is 13.2 bits. The ADC implemented in chartered 0.18 μm CMOS process consumes 260 mW, occupying a chip area of 7.16 mm2.

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References

  1. D’Amico, S., Cocciolo, G., Spagnolo, A., et al. (2014). A 7.65-mW 5-bit 90-nm 1-Gs/s folded interpolated ADC without calibration. IEEE Instrumentation and Measurement, 63(2), 295–303.

    Article  Google Scholar 

  2. Fang, B. N., & Wu, J. T. (2013). A 10-bit 300-MS/s pipelined ADC with digital calibration and digital bias generation. IEEE Solid-State Circuits, 48(3), 670–683.

    Article  MathSciNet  Google Scholar 

  3. Jia, H. Y., Chen, G. C., & Zhang, H. (2008). A high performance low power 12-bit 40 MS/s pipelined ADC. IEICE Electronics Express, 5(11), 400–404.

    Article  Google Scholar 

  4. Xiong, Zh. X., Cai, M., & He, X. Y. (2013). Digital background calibration for a 14-bit 100-MS/s pipelined ADC using signal-dependent dithering. In IEEE international conference of electron devices and solid-state circuits, 2013 (pp. 1–2).

  5. Shu, T. H., Song, B. S. & Bacrania, K. (1994). A 13-bit 10-MHz ADC background-calibrated with real-time oversampling calibrator. In Symposium on VLSI circuits, 1994 (pp. 13–14).

  6. Moon, U. K., & Song, B. S. (1997). Background digital calibration techniques for pipelined ADCs. IEEE Transactions on Circuits and Systems II, 44(2), 102–109.

    Article  Google Scholar 

  7. Wang, X., Hurst, P. J., & Lewis, S. H. (2003). A 12-bit 20-MS/s pipelined ADC with nested digital background calibration. In Custom integrated circuits conference, 2003 (pp. 409–412).

  8. Murmann, B., & Boser, B. E. (2003). A 12-bit 75-MS/s pipelined ADC using open-loop residue amplification. IEEE Journal of Solid-State Circuits, 38(12), 2040–2050.

    Article  Google Scholar 

  9. Chen, L., Ma, J., & Sun, N. (2014). Capacitor mismatch calibration for SAR ADCs based on comparator metastability detection. In IEEE international symposium on circuits and systems (ISCAS), 2014 (pp. 2357–2360).

  10. Keane, J. P., Hurst, P. J., & Lewis, S. H. (2005). Background interstage gain calibration technique for pipelined ADCs. IEEE Transactions on Circuits and Systems I, 52(1), 32–43.

    Article  Google Scholar 

  11. Grace, C. R., Hurst, P. J., & Lewis, S. H. (2005). A 12-bit 80-MSample/s pipelined ADC with bootstrapped digital calibration. IEEE Journal of Solid-State Circuits, 40(5), 1038–1046.

    Article  Google Scholar 

  12. Delic-Ibukic, A., & Hummels, D. M. (2006). Continuous digital calibration of pipeline A/D converters. IEEE Transactions on Instrumentation and Measurement, 55(4), 1175–1185.

    Article  Google Scholar 

  13. Karanicolas, A. N., Hae-Seung, L., & Barcrania, K. L. (1993). A 15-b 1-Msample/s digitally self-calibrated pipeline ADC. IEEE Journal of Solid-State Circuits, 28(12), 1207–1215.

    Article  Google Scholar 

  14. Ragab, K., Chen, L., Sanyal, A., & Sun, N. (2015). Digital background calibration for pipelined ADCs based on comparator decision time quantization. IEEE Transactions on Circuits and Systems: II, 62(5), 456–460.

    Google Scholar 

  15. Zhou, Y., Xu, B. W., & Chiu, Y. (2015). A 12 bit 160 MS/s two-step SAR ADC with background bit-weight calibration using a time-domain proximity detector. IEEE Journal of Solid-State Circuits, 50(4), 920–931.

    Article  Google Scholar 

  16. Gustavsson, M., Wikner, J. J., & Tan, N. N. (2000). CMOS data converters for communication. Boston: Springer.

    Google Scholar 

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Acknowledgments

This work was supported by the National High Technology Research and Development Program (“863” Program) of China (2015AA016901) and the Natural Science Foundation of Shanxi Province, China (Grant No. 2015011050).

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Correspondence to Huayu Jia.

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Jia, H., Lv, Y. A calibration technique based on sub-stages’ weights of pipelined ADC. Analog Integr Circ Sig Process 89, 223–229 (2016). https://doi.org/10.1007/s10470-016-0818-x

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  • DOI: https://doi.org/10.1007/s10470-016-0818-x

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