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A novel application of atomic force microscope to identify the Ag and I planes of β-AgI single crystals

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Material Research Innovations

Abstract

 Atomic Force Microscopy is used to determine the crystallographic polarity of the surfaces of β-AgI single crystals. The studies reveal that the hexagonal packed Ag+ plane is the (001) and the I– plane is the (001–). This observation is also consistent with the earlier x-ray diffraction measurements and chemical etching techniques as well as the polarizability and electronegativity of the ions.

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Authors and Affiliations

  1. 253 Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802, USA Phone: (814) 865-9293, Fax: (814) 865-2326 (8 1014) 863-9983 e-mail: asb2@psu.edu, US

    A. S. Bhalla & A. Manivannan

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  1. A. S. Bhalla
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  2. A. Manivannan
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Received: 27 October 1997/Accepted: 28 October 1997

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Bhalla, A., Manivannan, A. A novel application of atomic force microscope to identify the Ag and I planes of β-AgI single crystals. Mat Res Innovat 1, 197–203 (1997). https://doi.org/10.1007/s100190050040

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  • DOI: https://doi.org/10.1007/s100190050040

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