Abstract
A large size X-ray optic with a 12-inch silicon wafer is fabricated to increase X-ray collecting power. The 12-inch silicon optic is formed by a combination of photolithography, dry etching and chemical mechanical polishing techniques. Furthermore, in order to smooth surfaces of the etched sidewalls used as X-ray reflection plane, the optic is annealed with high temperature. To verify the surface profile, X-ray reflectivity measurements are conducted with Al K\(_{\alpha }\) 1.49 keV and reflected X-rays are detected for the first time. From the X-ray reflectivity data, it is suggested that the optic has ridge and slope structures on the sidewall surfaces, which decrease the reflection region by shadowing a part of the sidewall surface and changing a practical incident angle. An estimated surface roughness is \(\sim \)2 nm rms, which is consistent with the surface profiles measured by an atomic force microscope.
Similar content being viewed by others
References
Aschenbach B (2002) In-orbit performance of the XMM-Newton x-ray telescopes: images and spectra. Proc SPIE 4496:8
Ezoe Y, Koshiishi M, Mita M, Mitsuda K, Hoshino A, Ishisaki Y, Yang Z, Takano T, Maeda R (2006) Micro pore X-ray optics using anisotropic wet etching of (110) silicon wafers. Appl Opt 45:8932
Ezoe Y, Mitsuishi I, Takagi U, Koshiishi M, Mitsuda K, Yamasaki NY, Ohashi T, Kato F, Sugiyama S, Riveros RE, Yamaguchi H, Fujihira S, Kanamori Y, Morishita K, Nakajima K, Maeda R (2010) Ultra light- weight and high-resolution X-ray mirrors using DRIE and X-ray LIGA techniques for space X-ray telescopes. Microsyst Technol 16:1633
Mitsuda K et al (2007) The X-ray observatory Suzaku. PASJ 59:S1
Ogawa T, Ezoe Y, Moriyama T, Mitsuishi I, Kakiuchi T, Ohashi T, Mitsuda K, Putkonen M (2013) Iridium-coated micropore x-ray optics using dry etching of a silicon wafer and atomic layer deposition. Appl Opt 52:5949
Weisskopf MC, Brinkman B, Canizares C, Garmire G, Murray S, Van Speybroeck LP (2002) An overview of the performance and scientific results from the Chandra X-ray observatory. PASP 114:1
Wilkins SW, Stevenson AW, Nugent KA, Chapman H, Steenstrup S (1989) On the concentration, focusing, and collimation of x-rays and neutrons using microchannel plates and configurations of holes. Rev Sci Instrum 60:1026
Wolter H (1952) Glancing incidence mirror systems as imaging optics for x-rays. Ann Phys 445:94
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Ishikawa, K., Ezoe, Y., Numazawa, M. et al. 12-inch X-ray optics based on MEMS process. Microsyst Technol 23, 2815–2821 (2017). https://doi.org/10.1007/s00542-016-2980-6
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00542-016-2980-6