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Effect of substrate type on RF magnetron sputtered CuInS2 thin films properties based on nanoparticles synthesized by solvothermal route

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Abstract

Stereometric and fractal analyses have been performed on the three-dimensional surface microtexture of the sputtered copper indium disulfide films on various substrates. The target used in the sputtering was made from nanoparticles synthesized by the solvothermal route. The effects of substrate on structural and morphological properties of the films were investigated. The obtained CuInS2 films were polycrystalline textured, preferentially oriented in (112) crystallographic direction. Also, the (112) peak intensity changes with the substrate type. From atomic force microscopy (AFM) analysis, it can be concluded that the growth of the film on molybdenum substrate is promising for photovoltaic applications particularly as absorber layer in solar cells. The surface microtexture characterization in terms of surface dimensions, volume, curvature, shape was analyzed according to ISO 25,178–2: 2012 standard.

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Acknowledgements

This project was funded by the Ministry of Higher Education and Scientific Research, Tunisia. General Directorate of Scientific Research; Federated Research Projects (PRF); award number: PRF2019-D4P2.

Author information

Authors and Affiliations

  1. Laboratory of Physics of Materials and Nanomaterials Applied at Environment (LaPhyMNE), Faculty of Sciences in Gabes, Gabes University, 6072, Gabes, Tunisia

    Faouzi Ghribi & Lassaad El Mir Mabrouk

  2. Laboratoire de Procédés, Mathématiques Et Energie Solaire (PROMES-CNRS), Université de Perpignan, Rambla de la thermodynaque, Technosud, 66100, Perpignan Cedex, France

    K. Djessas

  3. Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI), 15 Constantin Daicoviciu St, 400020, Cluj-Napoca, Cluj County, Romania

    Ştefan Ţălu

  4. National Engineering School of Gabes, University of Gabès Member in the Laboratory of Physics of Materials and Nanomaterials Applied To the Environment, University of Gabes (LaPhymne), BP 193 El Hamma, 6020, Gabés, Tunisia

    Faouzi Ghribi

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  1. Faouzi Ghribi
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Appendix

Appendix

The statistical parameters of 3D surface roughness, according with ISO 25,178–2:2012 are defined as following [32].

(a) Height parameters are a class of surface finish parameters that quantify the Z-axis perpendicular to the surface.

(Sq) – root mean square height is the standard deviation of the height distribution, or RMS surface roughness.

(Ssk) – Skewness is the third statistical moment, qualifying the symmetry of the height distribution. Negative skew indicates a predominance of valleys, while positive skew is seen on surfaces with peaks.

(Sku) – Kurtosis is the fourth statistical moment, qualifying the flatness of the height distribution. For spiky surfaces, Sku > 3; for bumpy surfaces, Sku < 3; perfectly random surfaces have kurtosis of 3.

(Sp)—Maximum peak heightis the height between the highest peak and the mean plane.

(Sv)—Maximum pit height is the depth between the mean plane and the deepest valley.

(Sz)—Maximum height is the height between the highest peak and the deepest valley.

(Sa)—Arithmetical mean height is the mean surface roughness.

(b) Functional parameters are calculated from the Abbott-Firestone curve obtained by the integration of height distribution on the whole surface.

(Smr) -Areal material ratio is the bearing area ratio at a given height. Ratio of the area of the material at a specified height c (cut level) to the evaluation area. The Smr(c) is expressed as a percentage. For the Smr parameter, the height c is counted by default from the mean plane.

(Smc)—Inverse areal material ratio is the height c at which a given areal material ratio p is satisfied. The height is calculated from the mean plane.

(Sxp)—Extreme peak height is the difference in height between q% and p% material ratio. This parameter must be configured with two thresholds entered in %.

(c) Spatial parameters describe topographic characteristics based upon spectral analysis. They quantify the lateral information present on the X- and Y-axes of the surface.

(Sal)—Auto-correlation length is the horizontal distance of the autocorrelation function (tx, ty) which has the fastest decay to a specified value s, with 0 < s < 1. The default value for s in the software is 0.2. This parameter expresses the content in wavelength of the surface. A high value indicates that the surface has mainly high wavelengths (low frequencies).

(Str)—Texture-aspect ratio is the ratio of the shortest decrease length at 0.2 from the autocorrelation, on the greatest length. This parameter has a result between 0 and 1. If the value is near 1, we can say that the surface is isotropic, i.e. has the same characteristics in all directions. If the value is near 0, the surface is anisotropic, i.e. has an oriented and/or periodical structure.

(Std)—Texture direction calculates the main angle for the texture of the surface, given by the maximum of the polar spectrum. This parameter has a meaning if Str is lower than 0.5.

(d) Hybrid parameters are a class of surface finish parameters that quantify the information present on the X-, Y- and Z-axes of the surface, i.e. those criteria that depend both on the amplitude and the spacing, such as slopes, curvatures, etc.

(Sdq)—Root mean square gradient is the root-mean-square slope of the surface.

(Sdr)—Developed interfacial area ratio is the ratio of the increment of the interfacial area of the scale limited surface within the definition area over the definition area. The developed surface indicates the complexity of the surface thanks to the comparison of the curvilinear surface and the support surface. A completely flat surface will have a Sdr near 0%. A complex surface will have a Sdr of some percents.

(e) Functional volume parameters are typically used in tribological studies. They are calculated using the Abbott-Firestone curve (areal material ratio curve) calculated on the surface.

Vm(p)—Material volume is the volume of the material at a material ratio p (in %).

Vv(p)—Void volume is the volume of the voids at a material ratio p (in %).

Vmp—Peak material volume of the scale limited surface is the volume of material in the peaks, between 0% material ratio and a material ratio p (in %), calculated in the zone above c1. Vmp = Vm(p).

Vmc—Core material volume of the scale limited surface is the volume of material in the core or kernel, between two material ratios p and q (in %), calculated in the zone between c1 and c2. Vmc = Vm(q)—Vm(p).

Vvc—Core void volume of the scale limited surfaceis the volume of void in the core or kernel, between two material ratios p and q (in %), calculated in the zone between c1 and c2. Vvc = Vv(p)—Vv(q).

Vvv—Pit void volume of the scale limited surface is the volume of void in the valleys, between a material ratio p (in %) and 100% material ratio, calculated in the zone below c2. Vvv = Vv(p).

(f) Feature parameters are derived from the segmentation of a surface into motifs (hills and dales). Segmentation is carried out in accordance with the watersheds algorithm.

Spd—Density of peaks is the number of peaks per unit area.

Spc—Arithmetic mean peak curvature is the arithmetic mean of the principle curvatures of peaks within a definition area.

S10z— Ten point height is the average value of the heights of the five peaks with the largest global peak height added to the average value of the heights of the five pits with the largest global pit height, within the definition area. S10z = S5p + S5v

S5p—Five point peak height is the average value of the heights of the five peaks with the largest global peak height, within the definition area.

S5v—Five point pit height is the average value of the heights of the five pits with the largest global pit height, within the definition area.

Sda—Closed dale area is the average area of dales connected to the edge at height c.

Sha—Closed hill areais the average area of hills connected to the edge at height c.

Sdv—Closed dale volume is the average volume of dales connected to the edge at height c.

Shv—Closed hill volume is the average volume of hills connected to the edge at height c.

(g) Functional parameters (Stratified surfaces).

Sk is a measure of the “core” roughness (peak-to-valley) of the surface with the predominant peaks and valleys removed.

Spk is a measure of the peak height above the core roughness.

Svk is a measure of the valley depth below the core roughness.

Smr1 indicates the percentage of material that comprises the peak structures associated with Spk.

Smr2 relates to the percentage (i.e., 100%-Smr2) of the measurement area that comprises the deeper valley structures associated with Svk.

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Ghribi, F., El Mir Mabrouk, L., Djessas, K. et al. Effect of substrate type on RF magnetron sputtered CuInS2 thin films properties based on nanoparticles synthesized by solvothermal route. Appl. Phys. A 126, 805 (2020). https://doi.org/10.1007/s00339-020-03993-6

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