Abstract
Laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) in combination with scanning electron microscopy (SEM) and energy dispersive spectrometry (EDS) is used for the determination of elemental spatial distribution in ceramic multi-layer systems such as those found in intermediate-temperature solid oxide fuel cells (IT-SOFCs). Because layer sintering occurs at high temperature (usually well over 1000 °C), there may be mutual diffusion of ions from one layer to another, with dramatic consequences on cell performances. In this work, two model materials have been used to test LA-ICP-MS: La0.83Sr0.17Ga0.83Mg0.17O2.83 (LSGM), one of the most promising electrolytes for IT-SOFCs, and La0.8Sr0.2MnO3 (LSM), a highly representative perovskite material, which are amply used to design electrode materials. A two-layer system screen printed onto an LSM pellet (LSM–LSGM–LSM pellet) was successively sintered at a typical processing temperature, i.e. 1300 °C, for a short time (1 h). Elemental spatial distribution was determined by line profile analyses carried out on fracture surfaces; for comparison SEM-EDS line profiles were tested on the same surface. LA-ICP-MS line profile analysis evidenced that, notwithstanding the relatively low sintering temperature and short firing time (1 h per sintering), manganese cation diffusion into LSGM is relatively abundant, in agreement with previous literature reports and present EDS results. While line scan EDS analyses are not as conclusive for Ga and Mg diffusion, LA-ICP-MS shows that both ions diffuse across both interfaces, and Ga diffuses even over very long distances into the LSM pellet; on the contrary, only trace amounts of Mg can be found far from the LSGM/LSM interface.
Similar content being viewed by others
References
A.B. Stambouli, Renew. Sustain. Energy Rev. 15, 4507 (2011)
A. Tarancón, Energies 2, 1130 (2009)
E.D. Wachsman, K.T. Lee, Science 334, 935 (2011)
Z. Shao, W. Zhou, Z. Zhu, Prog. Mater. Sci. 57, 804 (2012)
M. Feng, J.B. Goodenough, Eur. J. Solid State Inorg. Chem. 31, 663 (1994)
T. Ishihara, H. Matsuda, Y. Takita, J. Am. Chem. Soc. 116, 3801 (1994)
K.Q. Huang, R. Tichy, J.B. Goodenough, J. Am. Ceram. Soc. 81, 2581 (1998)
K.Q. Huang, R.S. Tichy, J.B. Goodenough, J. Am. Ceram. Soc. 81, 2565 (1998)
K.Q. Huang, R.S. Tichy, J.B. Goodenough, J. Am. Ceram. Soc. 81, 2576 (1998)
D. Marrero-López, J.C. Ruiz-Morales, J. Peña-Martínez, M.C. Martín-Sedeño, J.R. Ramos-Barrado, Solid State Ion. 186, 44 (2011)
R. Pelosato, C. Cristiani, G. Dotelli, S. Latorrata, R. Ruffo, L. Zampori, J. Power Sources 195, 8116 (2010)
D.J.L. Brett, A. Atkinson, N.P. Brandon, S.J. Skinner, Chem. Soc. Rev. 37, 1568 (2008)
P. Datta, P. Majewski, F. Aldinger, J. Eur. Ceram. Soc. 29, 1463 (2009)
D. Lee, J.-H. Han, Y. Chun, R.-H. Song, D.R. Shin, J. Power Sources 166, 35 (2007)
K.Q. Huang, J.B. Goodenough, J. Alloys Compd. 303, 454 (2000)
D. Marrero-López, M.C. Martín-Sedeño, J. Peña-Martínez, J.C. Ruiz-Morales, P. Núñez-Coello, J.R. Ramos-Barrado, J. Am. Ceram. Soc. 94, 1031 (2011)
N.H. Menzler, F. Tietz, S. Uhlenbruck, H.P. Buchkremer, D. Stöver, J. Mater. Sci. 45, 3109 (2010)
X.G. Zhang, S. Ohara, R. Maric, K. Mukai, T. Fukui, H. Yoshida, M. Nishimura, T. Inagaki, K. Miura, J. Power Sources 83, 170 (1999)
C.M. Mari, R. Ruffo, G. Dotelli, I. Natali-Sora, R. Pelosato, Ionics 11, 29 (2005)
J.-H. Lee, K.N. Kim, J.-W.S.J. Kim, B.-K. Kim, H.-W. Lee, J. Moon, J. Mater. Sci. 42, 1866 (2007)
P. Datta, P. Majewski, F. Aldinger, Mater. Chem. Phys. 102, 125 (2007)
S.P. Jiang, J. Mater. Sci. 43, 6799 (2008)
K.Q. Huang, M. Feng, J.B. Goodenough, M. Schmerling, J. Electrochem. Soc. 143, 3630 (1996)
R. Pelosato, I. Natali Sora, G. Dotelli, R. Ruffo, C.M. Mari, J. Eur. Ceram. Soc. 25, 2587 (2005)
R. Pelosato, I. Natali Sora, V. Ferrari, G. Dotelli, C.M. Mari, Solid State Ion. 175, 87 (2004)
G.C. Kostogloudis, C. Ftikos, A. Ahmad-Khanlou, A. Naoumidis, D. Stover, Solid State Ion. 134, 127 (2000)
A. Naoumidis, A. Ahmad-Khanlou, Z. Samardzija, D. Kolar, Fresenius J. Anal. Chem. 365, 277 (1999)
D.I. Bronin, B.L. Kuzin, I.Y. Yaroslavtsev, N.M. Bogdanovich, J. Solid State Electrochem. 10, 651 (2006)
F. Zheng, Y. Chen, J. Mater. Sci. 43, 2058 (2008)
W. Gong, S. Gopalan, U.B. Pal, J. Electroceram. 13, 653 (2004)
K. Huang, J. Electrochem. Soc. 144, 3620 (1997)
J.Y. Yi, G.M. Choi, J. Eur. Ceram. Soc. 24, 1359 (2004)
J.Y. Yi, G.M. Choi, Solid State Ion. 175, 145 (2004)
X. Xu, C. Cao, C. Xia, D. Peng, Ceram. Int. 35, 2213 (2009)
C. Knöfel, H.-J. Wang, K.T.S. Thydén, M. Mogensen, Solid State Ion. 195, 36 (2011)
V. Sadykov, G. Alikina, A. Lukashevich, V. Muzykantov, V. Usoltsev, A. Boronin, S. Koscheev, T. Krieger, A. Ishchenko, A. Smirnova, O. Bobrenok, N. Uvarov, Solid State Ion. 192, 540 (2011)
J. Richter, P. Holtappels, T. Graule, T. Nakamura, L.J. Gauckler, Monatsh. Chem. 140, 985 (2009)
M. Yang, M. Zhang, A. Yan, X. Yue, Z. Houa, Y. Dong, M. Cheng, Electrochem. Solid-State Lett. 11, B34 (2008)
P.I. Cowin, C.T.G. Petit, R. Lan, J.T.S. Irvine, S.W. Tao, Adv. Energy Mater. 1, 314 (2011)
M. Liu, M.E. Lynch, K. Blinn, F.M. Alamgir, Y. Choi, Mater. Today 14, 534 (2011)
A.L. Soldati, L. Baque, H. Troiani, C. Cotaro, A. Schreiber, A. Caneiro, A. Serquis, Int. J. Hydrog. Energy 36, 9180 (2011)
S. Carter, A.S. Fisher, P.S. Goodall, M.W. Hinds, S. Lancaster, S. Shore, J. Anal. At. Spectrom. 25, 1808 (2010)
J.A. Kilner, S.J. Skinner, H.H. Brongersma, J. Solid State Electrochem. 15, 861 (2011)
J. Koch, D. Günther, Appl. Spectrosc. 65, 155 (2011)
A. Nevin, G. Spoto, D. Anglos, Appl. Phys. A 106, 339 (2011)
D. Miriello, I. Alfano, C. Miceli, S.A. Ruffolo, V. Pingitore, A. Bloise, D. Barca, C. Apollaro, G.M. Crisci, A. Oliva, M. Lezzerini, F. Chirico, N. Mari, C. Murat, Appl. Phys. A 106, 171 (2011)
B. Wagner, E. Bulska, W. Sobucki, J. Cult. Herit. 9, 60 (2008)
M. Gil, R. Green, M.L. Carvalho, A. Seruya, I. Queralt, A.E. Candeias, J. Mirão, Appl. Phys. A 96, 997 (2009)
L. Dussubieux, L. van Zelst, Appl. Phys. A, Mater. Sci. Process. 79, 353 (2004)
B. Giussani, D. Monticelli, L. Rampazzi, Anal. Chim. Acta 635, 6 (2009)
Z. Pan, W. Wei, F. Li, J. Mater. Sci., Mater. Electron. 22, 1594 (2011)
R. Dargel, F. Heinemeyer, M. Köntges, J. Vogt, C. Vogt, Microchim. Acta 165, 265 (2009)
D. Bleiner, P. Gasser, Appl. Phys. A 79, 1019 (2004)
A.V. Karasev, R. Inoue, Mater. Trans. 50, 341 (2009)
C. Strubel, L. Meckel, R. Effenberger, Glass Sci. Technol. 72, 15 (1999)
R.E. Wolf, C. Thomas, A. Bohlke, Appl. Surf. Sci. 127, 299 (1998)
J.S. Becker, U. Breuer, J. Westheide, A.I. Saprykin, H. Holzbrecher, H. Nickel, H.J. Dietze, Fresenius J. Anal. Chem. 355, 626 (1996)
J.S. Becker, J. Westheide, A.I. Saprykin, H. Holzbrecher, U. Breuer, H.J. Dietze, Mikrochim. Acta 125, 153 (1997)
M.T. Colomer, J.A. Kilner, Solid State Ion. 182, 76 (2011)
M. Holá, J. Kalvoda, H. Nováková, R. Škoda, V. Kanický, Appl. Surf. Sci. 257, 1932 (2011)
M. Stanislowski, D.H. Peck, S.K. Woo, L. Singheiser, K. Hilpert, O. Schulz, M. Martin, Fuel Cells 6, 270 (2006)
R. Polini, A. Pamio, E. Traversa, J. Eur. Ceram. Soc. 24, 1365 (2004)
M. Rozumek, P. Majewski, F. Aldinger, J. Am. Ceram. Soc. 87, 656 (2004)
R. Shannon, Acta Crystallogr. A, Found. Crystallogr. 32, 751 (1976)
A. Manthiram, J.-H. Kim, Y.N. Kim, K.-T. Lee, J. Electroceram. 27, 93 (2011)
Acknowledgements
The authors would like to thank Mr. Dario Picenoni for technical support for SEM-EDS analyses and Dr. Massimo Tiepolo for help during LA-ICP-MS analyses.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Dotelli, G., Pelosato, R., Zampori, L. et al. LA-ICP-MS and EDS characterization of electrode/electrolyte interfaces in IT-SOFC materials. Appl. Phys. A 111, 887–896 (2013). https://doi.org/10.1007/s00339-012-7309-4
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00339-012-7309-4