Abstract
In this paper, we investigated the two effects of a little H2 and NH3 gas on the properties of ZnO films grown by atmospheric pressure metal organic chemical vapor deposition (AP-MOCVD) using deionized water (H2O) and diethylzinc (DEZn) as the O and Zn sources, respectively. Experimental results showed that compared to the effect of a little H2, it could more effectively improve the surface morphology, crystalline structure, and optical quality of ZnO epilayers by adding a little NH3 gas into the growth ambient. Furthermore, by adding a little NH3 gas into the growth ambient, the hydrogen-related D0X1 (I4):3.365 eV peak disappeared in 10 K photoluminescence spectrum of ZnO films, which indicated the elimination of the unintended hydrogen impurity. The result of the Huang–Rhys factor S (0.113) showed that it was effective for reducing the probability of exciton–phonon scattering of ZnO films by adding a little NH3 gas into the growth ambient. The electron mobility of ZnO films were also significantly improved by this method with the mobility of 100 cm2V-1s-1 measured by Hall measurement at room temperature.
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71.55.Gs; 81.15.Gh; 78.55.-m; 78.55.Et; 68.55.-a
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Dai, J., Jiang, F., Pu, Y. et al. NH3-assisted growth approach for ZnO films by atmospheric pressure metal-organic chemical vapor deposition. Appl. Phys. A 89, 645–650 (2007). https://doi.org/10.1007/s00339-007-4248-6
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DOI: https://doi.org/10.1007/s00339-007-4248-6