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Automatic surface polishing based on probe measurement and force-position decoupling control

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Abstract

Automatic polishing is a valuable application of industrial intelligent manufacturing, requiring precise measurement tools and methods to obtain information about the polishing surface. Additionally, effective control strategies are necessary to guarantee optimal polishing results. In order to acquire the details about the polishing surface and the relationship between the object and the manipulator, a measuring device consisting of a two-degree-of-freedom (DOF) parallel platform equipped with a ruby probe is introduced. This device’s properties lead to the implementation of an adaptive trajectory generation algorithm for measurement, and the methods for parameter calibration and accuracy measurement are given. The polished object’s 3D surface is reconstructed through a surface fitting method. The polishing effect is directly determined by the control of position and force. This study developed a force-position decoupling control strategy that ensures constant normal contact force and simultaneous maintenance of tangential feed movement. The experiment’s non-standard column is polished in this paper using a 2DOF parallel measuring device and force-position decoupling control strategy. It compares the experimental effects of polishing using only the data from the measuring device, only the force decoupling control strategy, and both strategies combined. This paper concludes by presenting the surface roughness of the workpiece under the comprehensive polishing strategy. The findings demonstrate that the amalgamation of the measurement and control tactics presented in this manuscript has the potential to significantly contribute to automating the polishing process.

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Funding

This research was funded by the National Natural Science Foundation of China Grant No. 51927809.

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Authors and Affiliations

  1. School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China

    Hao Zheng, Chenbo Liang, Feng Gao & Chenkun Qi

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  1. Hao Zheng
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  2. Chenbo Liang
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  3. Feng Gao
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  4. Chenkun Qi
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Contributions

All authors contributed to the study conception and design. H. Z.: methodology, experimental analysis, software, and writing—original draft. C. L.: methodology, investigation, and writing—review and editing. F. G.: conceptualization, funding acquisition, and supervision. C. Q.: data curation, project administration, formal analysis, and validation. All authors read and approved the final manuscript.

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Correspondence to Feng Gao.

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The authors declare no competing interests.

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Zheng, H., Liang, C., Gao, F. et al. Automatic surface polishing based on probe measurement and force-position decoupling control. Int J Adv Manuf Technol 129, 2429–2442 (2023). https://doi.org/10.1007/s00170-023-12447-1

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  • DOI: https://doi.org/10.1007/s00170-023-12447-1

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