Summary
This paper outlines some of the major features of the NCEM facility at Berkeley. Some representative areas of research are also reviewed. The uniqueness of the HVEM (1.5 MeV) and ARM (1 MeV) enables acquisition of significant new results for a wide range of materials. By providing the highest possible resolutions for characterizing materials, structurally, morphologically and chemically, continuing improvements and new material designs can be tailored to specific applications.
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References
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Additional information
R. Gronsky, G. Thomas and K. H. Westmacott are engaged in research at the National Center for Electron Microscopy, Materials and Molecular Research Division, Lawrence Berkeley Laboratory.
Editior’s Note: A User’s Guide to the National Center for Electron Microscopy is available upon request from M. Moore, Administrator NCEM, Lawrence Berkeley Laboratory, Berkeley, California 94720.
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Gronsky, R., Thomas, G. & Westmacott, K.H. High Resolution, High Voltage and Analytical Electron Microscopy. JOM 37, 36–41 (1985). https://doi.org/10.1007/BF03257758
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DOI: https://doi.org/10.1007/BF03257758