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Studying fatigue deformation using scanning probe microscopy

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Abstract

Scanning probe microscopy is now a well-developed imaging technique for both insulating and conducting surfaces. In fatigue and mechanical deformation studies, surfaces are usually rough. Hence, in order to obtain quantitative surface topographic information with minimal distortion, sharp tips and light loads must be used as well as the usual care to minimize thermal drift and vibrations. Among the techniques being used are scanning tunneling microscopy and its major variant, atomic force microscopy.

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Authors
  1. Beizhi Zhou
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  2. Y. W. Chung
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Additional information

Beizhi Zhou earned his Ph.D. in materials science and engineering at Lehigh Univeristy in 1994. He is currently a research associate at Northwestern University.

Y.-W. Chung earned his Ph.D. in physics at the University of California at Berkeley in 1977. He is currently professor and chair at Northwestern University. Dr. Chung is also a member of TMS.

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Zhou, B., Chung, Y.W. Studying fatigue deformation using scanning probe microscopy. JOM 49, 43–45 (1997). https://doi.org/10.1007/BF02914766

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