Abstract
Laboratory modelling of earth’s subsurface stratification has been carried out using X-band microwave bistatic scatterometer system. Look angle variation of reflectivity for various subsurface layers under dry and wet conditions have been measured. From measured reflectivity data and the reciprocity theorem the emissivity and the brightness temperature variations have been computed, and the data are in good agreement with reported results. The importance of laboratory and field measurements and its remote sensing application has been discussed.
Similar content being viewed by others
References
Batlivala P P and Ulaby F T 1977 Univ. of Kansas Center for Research, Inc., RSL Tech. Rep. 264-12
Blinn J C III, Conel J E and Quade J C 1972J. Geophys. Res. 77 4366
Brekhovskibh L M and Beyer R T 1980 Layered Media (New York: Academic Press)
Caulfield M S 1978Radiative transfer theory applied to remote sensing of scattering media, M. S. Dissertation, Massachussetts Inst. of Tech.
Cost S T 1965 Antenna Laboratory, Ohio State Univ., Rept. 1822-2
Cumming W A 1952J. Appl. Phys. 23 768
England A W 1976Pure Appl. Geophys. 114 287
England A W and Johnson G R 1975Proc. 2nd U. N. Symp. on Development and Use of Geothermal Resources San Francisco
England A W and Johnson G R 1977Geophysics 42 514
Ford L H and Oliver R 1946Phys. Soc. 58 265
Fung A K and Eom H J 1981J. Quant. Spectrosc. Radiat. Transfer 26 397
Jha K K 1982Laboratory simulated microwave remote sensing studies, Ph.D. Thesis, Banaras Hindu University, India
Jha K K 1983U.S.A., Symp. Proc. pp. 54–61
Little R E 1978Probability and statistics for engineers (Portland, USA: Matrix Publishers) 133
Lundien J R 1966 Terrain analysis by electromagnetic means report 2 U.S.A. Waterways Exp. Sta., Vicksburg Miss, Tech. Rept. 3-693
Peake W H 1968 Wescon technical papers presented at the western electronic show and convention
Reeves R G 1975Manual of remote sensing (Falls Church, Virginia: American Society of Photogrammetry)
Shiue J C, Chang A, Boyne H and Ellerbruch D 1978Proc. 12th Int. Symp. Rem Sensing Environ, ERIM, Ann Arbor, Michigan
Ulaby F T, Batlivala P P and Dobson M C 1978IEEE Trans. GE-17 33
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Jha, K.K., Singh, K.P. & Singh, R.N. Measurements of reflection coefficients of stratified layers using X-band bistatic scatterometers. Proc. Indian Acad. Sci. (Earth Planet Sci.) 93, 117–127 (1984). https://doi.org/10.1007/BF02871991
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02871991