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An Inverse Problem for the ac Magnetic Force Microscopy of Superconductors

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Abstract

A basic inversion problem for the magnetic force microscopy (MFM) of a semiinfinite superconductor in the Meissner state is formulated, ac Detection is assumed, with the MFM tip oscillating at angular frequency Ω. The coupling of all electrodynamic fields is treated, including a normal-current density in the superconductor. Under certain assumptions on the tip and superconductor geometry, a unique penetration depth λ(z) can be recovered from onedimensional force gradient measurements. This development opens new possibilities for the nondestructive evaluation of superconducting crystals and films.

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Coffey, M.W. An Inverse Problem for the ac Magnetic Force Microscopy of Superconductors. J Supercond 10, 567–575 (1997). https://doi.org/10.1007/BF02767697

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