Abstract
Temperature-dependent Raman spectroscopy is used to investigate the effect of superconductivity on the near-surface electronic structure of a semiconductor in good electrical contact with a superconductor. The light scattering is performed through a high-quality thin (60–100Å) film of Nb, grown directly ontoin-situ Ar+-etched (100)-n+InAs. Below Tc, the LO mode, associated with the surface charge accumulation layer in the InAs, is enhanced by ∼40% in comparison with the nearby L_bulk phonon mode. This change, reversible upon temperature cycling, is observed only when the Nb is in good electrical contact with the InAs. Preliminary results show a similar effect on NbN/InAs. Our results constitute the first optical detection of the superconducting proximity effect.
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Support acknowledged by: The Department of Energy through the Materials Research Laboratory # DE-FG02-91-ER45439
Support acknowledged by: The Office of Naval Research #N00014-93-1-1168.
Support acknowledged by: The Fannie and John Hertz Foundation
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Greene, L.H., Dorsten, J.F., Roshchin, I.V. et al. Raman scattering as a probe of the superconducting proximity effect. Czech J Phys 46 (Suppl 6), 3115–3122 (1996). https://doi.org/10.1007/BF02548118
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DOI: https://doi.org/10.1007/BF02548118